20th International Zurich Symposium on
Electromagnetic Compatibility

Symposium Organization

Conference registration

Program Summary

Social Program - Tours

Technical Excursions

Technical Exhibition

Organized by:

Communication Technology Laboratory

Laboratory for Electromagnetic Fields and Microwave Electronics

Sponsor:

electrosuisse

Cooperating:

Honorary Chairman:

Prof. Dr. T. Dvorak, Stallikon

Organizing Committee:

(Symposium President)

(Past-President)

(Vice-President)

(Symposium Chairman)

(Technical Program Chairman)

(Technical Program Vice-Chairman)

(Joint Events)

(Public Relations)

(Exhibition and Technical Excursions)

(Registration)

(Local Arrangements)

(Treasurer)

(Social Program)

Technical Program Committee:

TC-1: EMC Management,

TC-2: EMC Measurement Techniques I (theory),

TC-3: EMC Measurement Techniques II (practice),

TC-4: EMC Environments I (stationary),

TC-5: EMC Environments II (transient),

TC-6: System Level EMC I (modeling),

TC-7: System Level EMC II (practical EMC aspects),

TC-8: Chip & Package Level EMC,

TC-9: Lightning,

TC-10: EMC Innovation,

TC-11: Power System EMC,

TC-12: EMC Protection,

Advisory Committee:

Organization	Prof. Dr. R. Vahldieck Dr. G. Meyer
Information, Hotels	Mrs. B. Howald
Exhibition	Dr. H. Kramer
Public Relations:	Dr. W. Borer
Registration	W. Blumer
Social Program	Mrs. E. Danieli
Treasurer:	T. Meier
Local Arrangements	R. Danieli (Social Events) J. Berchtold (Building Administration) R. Hunziker (Telephones) Dr. H. Kramer (Technical Excursions)
Audiovisual Means	J. Øerum C. Schmid
Session Vice-Chairmen	Ch. Bruns Dr. D. Erni M. Fries Dr. Ch. Fumeaux Dr. M. Kuhn
Webdesign and Programing	T. Meier
Conference Staff	Communication Technology Laboratory and Laboratory for Electromagnetic Fields and Microwave Electronics

Location, Transportation, Climate:

(ETHZ)

walking distance

Conference Registration:

Admission to the conference is only possible after receipt of the registration fee.

Registration Fee:

Speakers, authors, chairmen, committee members SFr. 500.-
Regular participants SFr. 600.-
The above full registration includes lectures, workshops, record, CD-ROM,
exhibition catalogue, coffee and cocktail tickets and a five-day pass for the
local public transportation (banquet not included).
One-day registration (lectures and workshop only) SFr. 210.
Retired (65) and Students (lectures and workshops only) SFr. 50.-
Spouse / guest registration (incl. welcome tea, cocktail) SFr. 60.-

(for registrants 1, 2 and 5)

(others)

Symposium Record and Reprints:

during coffee breaks only!

Organizing Committee

Addresses and telephones
during the conference:

Organizing Committee address:

gmeyer@nari.ee.ethz.ch

http://www.emc-zurich.ch/

PROGRAM SUMMARY

Opening Ceremony

Tuesday, February 18, 9.00 sharp at the «Auditorium Maximum» of the Federal Institute of Technology. Welcome addresses by Prof. U. Suter, Vice-President research, ETHZ, Prof. T. Hubing, President IEEE EMC Society and Dr. K.A. Hughes, ITU-R. Keynote speaker: Dr. M. Repacholi, WHO Geneva - What are the health effects of EMF and what to do about them. Other prominent personalities will participate.

Sessions

The technical program of the Symposium features 19 sessions, in which about 130 papers will be presented reflecting the recent results of EMC science and technology. Sessions A, D, E, F, M, P and Q, have been organized by Invited Chairmen who proposed session topics and solicited submissions for review by the Program Committee. Their outstanding contribution to the technical program is gratefully acknowledged.

Tutorial Lectures

The tutorial lectures on Monday, February 17, will review basic principles in areas fundamental to EMC. The objective of the courses is to provide better understanding of the regular session material. Workshops

The workshops and industrial forums cover selected areas of concern to the EMC engineer and manager. After introductory lectures, time will be reserved for questions and answers. Open Meetings

URSI Commissions E, a research cooperation on sustainable mobile communication and the EMC WG of IARU Reg. 1 have coordinated their meeting schedules with the Symposium. They welcome observers attending and participating in the discussions. Technical Exhibition

The exhibition will be directly adjoining the session rooms. Exhibits will range from instrumentation, measuring methods, shielding and components to EMC system design and education. Reception:

Tuesday, February 18,

Exhibitors Break

Cocktail Party,

EMC Exhibition.

Symposium Banquet

Wednesday, February 19, 19.30

Grand Hotel Dolder

Authors Lunch

"Dozenten-Foyer of the ETHZ"

Thursday, February 20, at 12.30

Farewell Party

Thursday, February 20,

good bye and hope to see you again in the near future in Zurich.

Social Program - Tours

Tuesday, February 18,

Technical Excursions

Friday, February 21,

Press conference

Monday, February 17, 11.00-12.30,

Authors attention!

Meet your session chairman

Sessions ABC: Tuesday, February 18, 10.00 sharp
Sessions DEFG: Tuesday, February 18, 13.30 sharp
Sessions HIJ: Wednesday, February 19, 8.30 sharp
Sessions KLM: Wednesday, February 19, 13.30 sharp
Sessions NOP/QRS: Thursday, February 20, 8.30 sharp
Hand over your slides at the Audio-Visual room F 33.1 (Floor F)

Sessions

TUESDAY, FEBRUARY 18

WEDNESDAY, FEBRUARY 19

THURSDAY, FEBRUARY 20

TUESDAY, FEBRUARY 18
A. Signal integrity and CAD modeling TUm
Invited Chairman: Prof. Dr. J. L. Drewniak

1A1 E. Laermans, D. De Zutter, Ghent University; J. Sercu, Agilent Technologies, Ghent, Belgium; S. Sercu, J. De Geest, FCI 's-Hertogenbosch, Netherlands: Signal integrity predictions using a modified method of moments approach.
2A2 C.-C. Kuo, T.-L. Wu, National Sun Yat-sen University, Kaohsiung, Taiwan: A time-domain SPICE model for coupled interconnects using the multi-conductor layer peeling technique.
3A3 S. Grivet-Talocia, I.S. Stievano, I.A. Maio, F.G. Canavero, Politecnico di Torino, Turin, Italy: Full-wave modeling of interconnected digital devices.
4A4 S.H. Min, M. Swaminathan, Georgia Institute of Technology, Atlanta, USA: Construction of broadband passive macromodels from frequency data for simulation of distributed interconnect networks.
5A5 Z.L. Wang, O. Wada, Y. Toyota, R. Koga, Okayama University, Okayama, Japan: Power bus resonance characteristics in multilayer printed circuit boards with slits.

B. Radio noise TUm
Chairman: Dr. A. Nickolaenko

6B1 W. Lauber, J. Bertrand, Communications Research Centre Canada/CRC, Ottawa, Canada: Update of VHF business noise data.
7B2 A.P. Nickolaenko, L.M. Rabinowicz, Ukrainian Nat. Academy of Sci., Kharkov, Ukraine; M. Hayakawa, University of Electro-Communications, Tokyo; K. Hattori, Chiba University, Chiba, Japan: Periodic variations of the Hurst exponent of the geomagnetic field.
8B3 A.V. Shvets, V.K. Ivanov, A.V. Varavin, Usikov's Inst. Radiophysics & Electronics, Kharkov, Ukraine: Schumann resonance observations within urban areas.
9B4 V.I. Larkina, IZMIRAN, Troitsk, Russia: Information about the environment obtained from low frequency radio noise measurements.

C. EM field sensors TUm
Chairman: Prof. Dr. J.-L. ter Haseborg

10C1 H. Frick, G.V. Meyer, Swiss Federal Inst. of Technology Zurich, Switzerland: An electro-optic E-field probe.
11C2 W. Mann, K. Petermann, Technical University Berlin, Germany: Miniaturized electro-optical E-field probes with integrated preamplifier for time-domain measurements.
12C3 B.G. Loader, M.J. Alexander, W. Liang, National Physical Laboratory, Teddington, United Kingdom; S. Torihata, Tokin Corporation, Kawasaki-City, Japan: An optical electric field probe for specific absorption rate measurements.
13C4 E. Suzuki, T. Miyakawa, H. Ota, R. Sato, Sendai EMC Research Center; K.I. Arai, Tohoku University, Sendai, Japan: Characteristics of an optical magnetic probe consisting of a loop antenna element and a bulk electro-optic crystal.
14C5 J. D. Norgard, University of Colorado, Colorado Springs; J. E. Will, Sun Microsystems, Palo Alto; C. F. Stubenrauch, NIST, Boulder, USA: Infrared measurements of phased array aperture distributions.

D. Wired networks TUa
Invited Chairman: Dr. P. Beeckman

15D1 P.A. Beeckman, J. van der Merve, Philips Digital Systems Laboratory, Eindhoven, Netherlands: Wired communication networks and EMC: An overview.
16D2 F. Weinmann, K. Dostert, University of Karlsruhe, Germany: Modelling of the far field radiation of widespread power line communication applications.
17D3 R. Vick, EMV-Beratungs- & Planungsbuero, Dresden, Germany: Estimating the radiated emissions of domestic main wiring caused by power-line communication systems.
18D4 I.D. Flintoft, M.H. Capstick, A.C. Marvin, University of York; A.D. Papatsoris, D.W. Welsh, York EMC Services, York, United Kingdom: Radiated emissions from unstructured networks: Potential impact on maritime and aeronautical radio.
19D5 F.M. Tesche, Clemson University, Clemson; B.A. Renz, Amperion, Chelmsford; R.M. Hayes, American Electric Power, Columbus; R.G. Olsen, Washington State University, Pullman, USA: Development and use of a multiconductor line model for PLC assessments.
20D6 D.W. Welsh, York EMC Services; A.C. Marvin, University of York, York, United Kingdom: Investigation of telecommunication cabling relevant to EN 55022 modem test method.

E. Intentional EMI TUa
Invited Chairman: Dr. W.A. Radasky

21E1 W.A. Radasky, Metatech Corporation, Goleta, USA; M.W. Wik, Defence Material Administration, Stockholm, Sweden: Intentional electromagnetic interference (IEMI) - Understanding the threat and developing protection concepts.
22E2 F. Sonnemann, Diehl Munitionssysteme, Roethenbach, Germany: Susceptibility investigations of high-power EM-fields on electronic systems.
23E3 D. Nitsch, F. Sabath, Res. Institute for Protective Technologies / WIS, Muenster; H.-U. Schmidt, C. Braun, Fraunhofer Institut / INT, Euskirchen, Germany: Comparison of the high power microwave and ultra wide band susceptibility of modern microprocessor boards.
24E4 M.A. Messier, K.S. Smith, W.A. Radasky, M.J. Madrid, Metatech Corporation, Goleta, USA: Response of telecom protection to three IEC waveforms.
25E5 C.E. Baum, Air Force Res. Lab., Kirtland AFB, USA: A transmission-line transformer for matching the switched oscillator to a higher-impedance resistive load.
26E6 M. Koch, Autoflug, Rellingen; M. Camp, H. Garbe, University of Hannover; R. Kebel, Airbus Deutschland, Hamburg; F. Sabath, D. Nitsch, Scientific Institute for Protection Technologies / WIS, Muenster, Germany: Protection properties of advanced textile shields determined in frequency and time domain.

F. Base stations and non-ionizing radiation TUa
Invited Chairman: H. Ryser

27F1 G. Neubauer, H. Haider, K. Lamedschwandner, ARC Seibersdorf Research, Seibersdorf, Austria; M. Riederer, R. Coray, OFCOM, Biel, Switzerland: Measurement methods and legal requirements for exposure assessment next to GSM base stations.
28F2 R. Coray, P. Kraehenbuehl, Swiss Federal Office for Communication, Biel, Switzerland: Non-ionizing radiation exposure assessment in the city of Salzburg: A study of the Swiss Federal Office for Communication.
29F3 M. Riederer, Swiss Fed. Office of Communications, Biel, Switzerland; G. Neubauer, ARC Seibersdorf Research, Seibersdorf, Austria: Measuring the low power, instantaneous urban field strengths due to GSM base stations.
30F4 H. Lehmann, P. Fritschi, B. Eicher, Swisscom, Bern, Switzerland: The variability of the electric field in rooms near mobile phone base stations.
31F5 C. Olivier, L. Martens, Ghent University, Ghent, Belgium: Exposure assessment around UMTS base stations: Extension of existing measuring procedures.
32F6 H. Ryser, METAS, Bern-Wabern, Switzerland: Measuring campaign for the assessment of the non-ionising radiation near GSM base stations.

G. Transmission lines and cables TUa
Chairman: Dr.

33G1 M. Ye, Ericsson, Stockholm, Sweden: EMI radiation from shielded signal cable inside a subrack.

34G2 D. Bellan, G. Spadacini, S. Pignari, Politecnico di Milano, Milan, Italy: Prediction of twist non-uniformity and twist-residual effects on crosstalk in twisted-wire pairs.

35G3 M. Leone, Siemens, Erlangen, Germany: Closed-form expressions for the common-mode inductance of single and differential traces above a ground plane with a slit.

36G4 B. Zhang, X. Cui, M. Wu, Z. Zhao, L. Li, North China Electric Power University, Baoding City, China: Analysis of the effect of a two-end grounded cable on the performance of a large grounding grid.

37G5 G. Moenich, TU Berlin; M. Leone, Siemens, Erlangen, Germany: On the coupling of slits in electrically small enclosures to external cabling structures.

38G6 F. Kosdikian, F. Paumier, EADS, Suresnes; J.L. Ballenghien, Airbus France, Toulouse, France: EMC on new efficient and economic cabling system.

WEDNESDAY, FEBRUARY 19
H. Test chambers WEm

Chairman: Dr. P. Leuchtmann

39H1 A. Nothofer, M.J. Alexander, National Physical Laboratory, Teddington; D. Bozec, D. Welsh, L. Dawson, L. McCormack, A.C. Marvin, University of York, Heslington, United Kingdom: A GTEM best practice guide - Applying IEC 61000-4-20 to the use of GTEM cells.

40H2 M. Schmidt, University of Applied Sciences, Jena, Germany: On calibration of field strength meters in GTEM cells: Practical aspects and uncertainty.

41H3 F. Xiao, K. Murano, Y. Kami, University of Electro-Communications, Tokyo, Japan: A new four-septum TEM cell with multi-polarizations for use in immunity testing.

42H4 F. Moglie, University of Ancona, Italy: Finite difference, time domain analysis convergence of reverberation chambers.

43H5 C. Bruns, P. Leuchtmann, R. Vahldieck, Swiss Fed. Inst. of Technology Zurich, Switzerland: Three-dimensional method of moments simulation of a reverberation chamber in the frequency domain.

44H6 I. Junqua, F. Issac, B. Michielsen, C. Fiachetti, ONERA, Toulouse, France: Relation between variances of scattering parameters at an equipment input port tested in a reverberating chamber.

45H7 V. Deniau, J. Rioult, M. Heddebaut, M. Klingler, INRETS-LEOST; B. Demoulin, TELICE, Villeneuve d'Ascq, France: Comparison between reflection S-parameter measurements in a reverberating chamber and in free space at lower frequencies.

46H8 L.R. Arnaut, National Physical Laboratory, Teddington, United Kingdom: Nonstationary effects in mode-stirred reverberation.

I. EMC modeling WEm

Chairman: Prof. Dr. H. Singer

47I1 M. Sabielny, H.-D. Bruens, TU Hamburg-Harburg, Hamburg, Germany: Practical aspects of the physical optics - moment method hybrid method.

48I2 U. Jakobus, I.P. Theron, EM Software & Systems, Stellenbosch, South Africa: Analysis of coated metallic surfaces with physical optics for the solution of high-frequency EMC problems.

49I3 A. Karwowski, M. Surma, D. Wojcik, Silesian University of Technology, Gliwice, Poland: Efficient wideband analysis of electromagnetic scattering and radiation problems using the AWE/MBPE adaptive method with the method of moments.

50I4 M. Vahdani, M.M. Danaei, Tehran University; J. Rashed-Mohassel, Emam Hosein University, Tehran, Iran: Analysis of external EM wave coupling to an arbitrary shape microstructure using method of moments.

51I5 N. Doncov, J. Wlodarczyk, R. Scaramuzza, V. Trenkic, Flomerics, Nottingham, United Kingdom: Modelling of airflow aperture arrays using transmission line matrix (TLM) method.

52I6 S. Le Maguer, M.M. Ney, LEST, Brest, France: Split step TLM for efficient electromagnetic simulation of small heterogeneous apertures.

53I7 S. Pernet, X. Ferrieres, ONERA, Toulouse; G. Cohen, INRIA, Le Chesnay, France: An original finite element method to solve Maxwell's equations in time domain.

54I8 J. Trinkle, A. Cantoni, K. Fynn, University of Western Australia, Crawley, Australia: Efficient impedance calculation of loaded power ground planes.

J. EMC innovation WEm

Chairman: Prof. Dr. A. Orlandi

55J1 J.A. Bracco, P. Burrascano, E. Cardelli, A. Faba, S. Fiori, University of Perugia, Italy: A possible identification and control technique of artificial EM sources.

56J2 J.M.G. Bueno, University of Malaga, Spain: An EMI source finding method based on a neural network.

57J3 K. Aunchaleevarapan, S. Kaophenyai, NECTEC; W. Khan-ngern, Y. Prempraneerach, King Mongkut's Inst. of Technology, Bangkok, Thailand: Recognition and identification of a computer and an electronic ballast by radiated EMI using a neural network.

58J4 M. Heidemann, S. Fisahn, H. Garbe, University of Hannover; P. Kralicek, Fraunhofer Institute Reliability & Microintegration, Paderborn, Germany: Parameterization of a PCB-emission model by measurement.

59J5 G. Spadacini, S. Pignari, Politecnico di Milano, Milan, Italy: The statistical equivalence of bulk current injection and random-field radiation.

60J6 A. Bajwa, MED Labs, Perry Hall, USA: Broadband radar absorber design with pareto genetic algorithm, based on R-L-C model of Salisbury screens.

61J7 I.S. Stievano, I.A. Maio, F.G. Canavero, Politecnico di Torino, Turin, Italy: Temperature-dependent macromodels of digital devices.

62J8 R. Saraei, J. Rashed-Mohassel, Tehran University, Tehran, Iran: Scalar and vector potentials in chiral media.

K. Emission and immunity testing WEa

Chairman: Prof. Dr. K.-H. Gonschorek

63K1 M.J. Windler, Underwriters Laboratories, Northbrook; D. Camell, NIST, Boulder, USA: Research on site qualifications above 1 GHz.
64K2 K. Osabe, T. Komatsuzaki, Matsushita Communication Ind., Yokohama; T. Yamanaka, Akzo Nobel, Ibaraki; J. Kawano, Voluntary Control Council for Interference/VCCI, Tokyo, Japan: Experimental comparison of test site validation method with a half-wave dipole antenna and a biconical antenna.
65K3 T. Williams, Elmac Services, Chichester; S.L. Baker, Schaffner EMC Systems, Capel, United Kingdom: Uncertainty contributions in the conducted immunity test.
66K4 M. Hoeijer, M. Baeckstroem, J. Loren, FOI, Linkoeping, Sweden: Angular patterns in low level coupling measurements and in high level radiated susceptibility testing.
67K5 S. Battermann, H. Garbe, University of Hannover, Germany: Optimizing an open area test site for horizontal and vertical polarization.
68K6 J.S. McLean, R. Sutton, TDK RF Solutions, Cedar Park, USA: Quantitative prediction of balancing errors in measurements on open area test sites.
69K7 F. Fiori, F. Musolino, Politecnico di Torino, Turin, Italy: Measurement of IC radiated emissions by a novel technique.
70K8 F. Fiori, P.S. Crovetti, Politecnico di Torino, Turin, Italy: Comparison of the susceptibility to EMI of MOS and BJT operational amplifiers.

L. Power and rail system and components WEa

Chairman: Prof. Dr. M. Ianoz

71L1 L. Mueller, K. Feser, University of Stuttgart; E. Fauser, Robert Bosch Corp. Res., Germany: Experimental investigation and modeling of brush discharges for charged dielectric materials.

72L2 R. De Leo, V. Mariani Primiani, University of Ancona; R. Elisei, M. Marconi, COMELIT, Castelfidardo, Italy: Characterization of three winding transformers for the reduction of switched mode power supply conducted emissions.

73L3 V. Tarateeraseth, C. Tantisukarom, W. Khan-ngern, King Mongkut's Inst. of Technology/KMITL, Bangkok, Thailand; S. Nitta, Salesian Polytechnic, Tokyo, Japan: A study of EMI characteristics of an off-line single-stage AC/DC flyback converter with power factor correction tapped transformer.

74L4 G. Lucca, Sirti S.p.a., Milan, Italy: Statistical model of the radio frequency electromagnetic field emitted by an electrified railway line.

75L5 T.N. Serdyuk, National University of Railway Transport, Dnepropetrovsk, Ukraine: Influence of a railway traction system on nearby small-current devices.

76L6 B.W. Jaekel, Siemens Automation & Drives, Erlangen, Germany: EMC aspects of electronic interlocking in railway systems.

77L7 O. Bottauscio, G. Crotti, G. Farina, A. Manzin, IEN Galileo Ferraris; A. Canova, M. Tartaglia, Politecnico di Torino, Turin, Italy: Magnetic field generated by tramway systems and possible field mitigation.

M. Large chip and package EMC modeling WEa

Invited Chairmen: Dr. A. Ruehli, Prof. Dr. G. Antonini

78M1 G. Antonini, University of L'Aquila, Aquila, Italy; A.E. Ruehli, IBM Research Division, Yorktown Heights, USA: Fast element evaluation for the partial element equivalent circuit method using a multipole approach.

79M2 R. Araneo, S. Celozzi, University of Rome "La Sapienza", Rome, Italy: A general procedure for the extraction of lumped equivalent circuits from full-wave electromagnetic simulations of interconnect discontinuities.

80M3 G. Steinmair, BMW; H. Katzier, Siemens, Munich; R. Weigel, University Erlangen-Nuernberg, Erlangen; M. Troescher, Sim Lab Software, Munich, Germany: Switching noise simulation on packages and on PCBs using PEEC and model order reduction techniques.

81M4 G. Antonini, A. Orlandi, University of L'Aquila, Poggio di Roio, Italy; J. Ekman, Lulea Univ. of. Technology, Lulea, Sweden: Integration order selection rules for a full wave PEEC solver.

82M5 M. Leone, V. Navratil, Siemens, Erlangen, Germany: Analysis of the common-mode radiation from differential signalling on printed circuit boards.

83M6 M. de Magistris, Universita di Napoli "Federico II", Naples; A. Maffucci, Universita di Cassino, Italy: Identification of a SPICE reduced-order model for lossy interconnects from terminal behavior.

84M7 T. Brandtner, Infineon Technologies, Graz, Austria; R. Weigel, University Erlangen-Nuernberg, Erlangen, Germany: Simulation and analysis of substrate coupling accelerated by precalculated macromodels .

85M8 E. Gad, M. Nakhla, Carleton University, Ottawa, Canada: Efficient simulation of nonuniform transmission lines using the integrated congruent transform.

THURSDAY, FEBRUARY 20
N. Automotive EMC THm

Chairman: Dr. F. Rachidi

86N1 R. Neumayer, A. Stelzer, University Linz, Austria; F. Haslinger, G. Steinmair, BMW; M. Troescher, SIMLAB; J. Held, B. Unger, Siemens, Muenchen; R. Weigel, University Erlangen-Nuernberg, Erlangen, Germany: Numerical EMC-simulation for automotive applications.

87N2 X. Ferrieres, J.P. Parmantier, S. Bertuol, ONERA, Toulouse, France; A. Ruddle, Motor Industry Research Assoc., Nuneaton, United Kingdom: Modeling EM coupling onto vehicle wiring based on the combination of a hybrid FV/FDTD method and a cable network method.

88N3 R. Zaridze, K. Tavzarashvili, G. Ghvedashvili, D. Kakulia, G. Saparishvili, A. Bijamov, Tbilisi State University, Tbilisi, Georgia: The method of auxiliary sources for numerical modeling of EMC/EMI in vehicles and specific absorption rate problems.

89N4 A.R. Ruddle, MIRA, Nuneaton, United Kingdom: Computed impact of optional vehicle features (sunroof and windscreen heater) on automotive EMC characteristics.

90N5 F. Crisci, M. De Riso, ELASIS, Pomigliano; R. De Leo, V.M. Primiani, University of Ancona, Italy: A comparison of immunity test methods for automotive testing.

91N6 A.R. Ruddle, MIRA, Nuneaton, United Kingdom: Measured impact of seats and glazing on the coupling of electromagnetic fields into vehicles and their wiring harnesses.

92N7 F. Duval, B. Mazari, B. Freyre, Ph. Lefebvre, J. Zigault, ESIGELEC IRSEEM, Mt. Saint Aignan; O. Maurice, VALEO, Creteil, France: Bulk current injection test modeling and creation of a test methodology.

O. System EMC THm

Chairman: Dr. A. Kaelin

93O1 S.F. Legowski, D.P. Barp, University of Wyoming, Laramie, USA: Empirical study of spectral distribution of EMI emissions of modern adjustable speed drives.

94O2 C. Keller, K. Feser, University of Stuttgart, Germany: Non-linear superposition of broadband spectra for fast emission measurements in time domain.

95O3 M. Ouzzif, F. Moulin, A. Zeddam, F. Gauthier, France Telecom, Lannion, France: Evaluation of the impulse noise impact on DMT-VDSL system performance.

96O4 F. Deter, Bauknecht Hausgeraete, Schorndorf; L. Dunker, Reg. TP, Berlin; W. Kleppmann, Fachhochschule Aalen, Germany: New method for the statistical evaluation of RFI measurements.

97O5 O.M. Ramahi, University of Maryland, College Park; T. Kamgaing, Motorola Semiconductor Products Sector, Tempe, USA: Mitigation of simultaneous switching noise using electromagnetic band gap structures.

98O6 A. Knobloch, H. Garbe, University of Hannover, Germany: Bit error rates due to CW-interference.

99O7 F. Arteche, F. Szoncso, CERN, Geneva, Switzerland; C. Rivetta, Fermilab, Batavia, USA: Electromagnetic compatibility plan for the compact muon solenoid detector at CERN.

100O8 C.A. Ropiak, D.C. Stoudt, Naval Surface Warefare Center, Dahlgren, USA: Conditioned hardening of test objects due to repeated EMI testing.

P. Lightning and its effects THm

Invited Chairman: Prof. Dr. V. Rakov

101P1 V.A. Rakov, M.A. Uman, J. Schoene, J. Jerauld, K.J. Rambo, G.H. Schnetzer, B.A. DeCarlo, University of Florida, Gainesville; D.E. Crawford, NASA, Kennedy Space Center, USA; M. Miki, CRIEPI, Tokyo, Japan: Close lightning electromagnetic environment: Triggered lightning experiments.

102P2 B. Kordi, University of Manitoba, Winnipeg, Canada; R. Moini, Amirkabir Univ. of Technology, Tehran, Iran; V.A. Rakov, University of Florida, Gainesville, USA: Comparison of lightning return stroke electric fields predicted by the transmission line and antenna theory models.

103P3 J.M. Cvetic, B.V. Stanic, University of Belgrade, Serbia and Montenegro; F. Heidler, Fed. Armed Forces University Munich, Neubiberg, Germany: Behaviour of the rise and fall characteristics of the channel discharge function for the generalized lightning traveling current source return stroke model.

104P4 N. Taavousi, R. Moini, S.H.H. Sadeghi, Amirkabir Univ. of Technology, Tehran, Iran: A neural network method for locating cloud-to-ground lightning stroke channels, using radiated electric field waveform data.

105P5 A. Ageyev, Seversk State Institute of Technology, Seversk, Russia; A. Gandelli, R.E. Zich, Politecnico di Milano, Italy: Analysis of lightning signals by a Haar-based wavelet approach.

106P6 L. Grcev, Techn. University Eindhoven, Netherlands: Dynamic behavior of grounding grids.

107P7 G. Maslowski, R. Ziemba, Rzeszow University of Technology, Rzeszow, Poland: The magnetic field attenuation inside a structure with an unscreened window for the case of direct and nearby lightning strikes.

Q. Analysis of electrically large systems THa

Invited Chairman: Prof. Dr. J. Nitsch

108Q1 J. Nitsch, H. Mecke, Z.A. Styczynski, G. Wollenberg, H.G. Krauthaeuser, Otto-von-Guericke University Magdeburg, Germany: Analysis methods for electrically large systems - From the particular to the general (FOR 417).

109Q2 R. Doebbelin, T.K. Czarnecki, H. Mecke, Th. Winkler, Otto-von-Guericke University Magdeburg, Germany: Magnetic fields in the vicinity of welding installations.

110Q3 A. Bachry, Z.A. Styczynski, Otto-von-Guericke University Magdeburg, Germany; I.I. Golub, Energy Systems Intitute, Irkutsk, Russia: An evaluation of distribution power system susceptibility to low frequency conducted disturbances under different load conditions.

111Q4 C.E. Baum, Air Force Res. Lab. Kirtland AFB, USA; T. Steinmetz, Otto-von-Guericke University Magdeburg, Germany: An interpolation technique for analyzing sections of nonuniform multiconductor transmission lines.

112Q5 H. Haase, J. Nitsch, Otto-von-Guericke University Magdeburg, Germany: Investigation of nonuniform transmission line structures by a generalized transmission-line theory.

113Q6 S. Tkachenko, J. Nitsch, T. Steinmetz, Otto-von-Guericke University Magdeburg, Germany; F. Rachidi, Swiss Fed. Inst. of Technology, Lausanne, Switzerland: Electromagnetic field coupling to nonuniform transmission lines: Treatment of discontinuities.

114Q7 G. Wollenberg, S.V. Kochetov, Otto-von-Guericke University Magdeburg, Germany: Modeling the skin effect in wire-like 3D interconnection structures with arbitrary cross section by a new modification of the PEEC method.

115Q8 H.G. Krauthaeuser, J. Nitsch, Otto-von-Guericke University Magdeburg, Germany: Effects of the variation of the excitation and boundary conditions of mode-stirred chambers and consequences for calibration and measurements.

R. Shielding THa

Chairman: Prof. Dr. P. Degauque

116R1 M. Istenic, University of Ljubljana, Slovenia; R.G. Olsen, Washington State University, Pullman, USA: A simple hybrid method for optimizing the performance of 2-D planar conductive ELF magnetic field shields.

117R2 A. Binner, K.-H. Gonschorek, Dresden Univ. of Technology, Dresden, Germany: Design of nonlinear magnetic shields using the finite-element-method.

118R3 L. Albini, P. Burrascano, E. Cardelli, A. Faba, University of Perugia, Italy: Studies of non-oriented Si-Fe iron multilayer shields at industrial frequencies.

119R4 T.M. Schaefer, J. Maurer, W. Wiesbeck, Universitaet Karlsruhe, Germany: Attenuation measurements of different walls and rooms in hospitals.

120R5 M. D'Amore, M.S. Sarto, M. Bertolotti, M.C. Larciprete, M. Scalora, C. Sibilia, University of Rome "La Sapienza"; F. Sarto, ENEA Research Center, Rome, Italy: Nanotechnology of transparent electromagnetic shields.

121R6 A. Gavrilakis, A.P. Duffy, De Montfort University, Leicester; K.G. Hodge, A.J. Willis, Brand-Rex, Glenrothes, United Kingdom: An enhanced model for a helically wound tape shield.

122R7 B. Colak, TUBITAK UEKAE, Kocaeli; O. Cerezci, Sakarya University, Sakarya, Turkey; N. Ari, Univ. of Applied Sciences, Zurich, Switzerland: Modelling of electrically contacting double braided coaxial cable shields as triaxial cable shields.

123R8 G. Cerri, P. Russo, University of Ancona, Italy: A MFIE-FDTD hybrid method for the evaluation of the field inside metallic enclosures with slots.

S. Instrumentation and measurement THa

Chairman: Dr. P. Wilson

124S1 K. Muenter, R. Pape, M. Spitzer, J. Glimm, Physik.-Techn. Bundesanstalt/PTB, Braunschweig; R. Bitzer, Narda Safety Test Solutions, Pfullingen, Germany: Traceable calibration of magnetic field transfer sensors up to 1 GHz in a radiated standing wave pattern.

125S2 H. Hirayama, Y. Kami, University of Electro-Communications, Tokyo, Japan: Near-field measurement using a Yee scheme for source location and Poynting vector evaluation.

126S3 F.J. Sanchez, M. Quilez, Univ. Politecnica de Catalunya, Castelldefels; P.J. Riu, F. Silva, Univ. Politecnica de Catalunya, Barcelona, Spain: A low-cost analog fiber optic link for EMC applications.

127S4 A. Maeda, VCCI, Tokyo; S. Takeya, S. Kobayashi, Akzo Nobel, Ibaraki; S. Ohtsu, T. Yamagajo, Fujitsu, Nakahara, Japan: Development of an antenna factor calibration method for EMI testing in quasi-free space.

128S5 S. Boenisch, W. Kalkner, Technical University Berlin, Germany: Influence of the approach speed, charge voltage and electrode material on the intensity and reproducibility of short gap electrostatic discharges.

129S6 S. Coets, V. Beauvois, W. Legros, University of Liege; J. Catrysse, KHBO, Oostende; Belgium: Accuracy considerations for conducted emission measurements performed on large systems.

130S7 H. Ryser, METAS, Bern-Wabern, Switzerland: Experience with new calibration and test site validation methods for the absorbing clamp.

131S8 J. Sroka, Schaffner EMC, Luterbach, Switzerland: Oscilloscope influence on the calibration uncertainty of the peak current of ESD simulators.

TUTORIAL LECTURES

Chairman: Dr. F. Rachidi, Lausanne, Switzerland
Objective: The objective of the tutorial presentations is to provide overviews of the basics of certain important EMC topics for the purpose of assisting the attendees in their understanding of the material presented in the technical sessions.
T1. Modeling and Simulation of Electrical Interconnects, Packages, and Devices for High-Speed Applications
      (Monday, February 17, 11.00 - 13.00, room F 5)
Lecturer: Prof. F. Canavero, Politecnico di Torino, Turin, Italy; Prof. M. Nakhla, Carleton University, Ottawa, Canada; Dr. A. Ruehli, IBM Research Division, Yorktown Heights, NY, USA
Topics: With increasing demands for high signal speeds and circuit density, non-ideal behavior of interconnects and components have become more and more important for the performance and EMC compliance of modern electronic devices and systems.
This tutorial presents an overview of state-of-the-art techniques for electrical interconnect and packaging modeling, for their reduced-order equivalent circuit extraction, and for behavioral characterization of digital devices.
Applications cover a wide spectrum of implementation hierarchy, from chip level to printed circuit boards.
Lectures:

Introduction and motivation (F. Canavero)
Electromagnetic modeling of EIP´s (A. Ruehli)
Model order reduction techniques (M. Nakhla)
Macromodeling via system identification (F. Canavero)
Behavioral models of digital devices (F. Canavero)

T2. Genetic Applications for EMC
      (Monday, February 17, 14.00 - 16.00, room F 5)
Lecturer: Prof. G. Antonini and Prof. A. Orlandi, University of L´Aquila, Italy
Topics: Optimization problems often arise in EMC and EMI problems. The objective functions that are found in electromagnetic optimization problems are usually highly non-linear, stiff, multi-extremal and non-differentiable. In addition they are often computationally expensive to evaluate. Standard deterministic optimization methods have significant drawbacks when applied to this kind of problems. Genetic algorithms (GA´s) have shown appealing properties which make them suitable for electromagnetic optimization problems involving many parameters in a high-dimension multi-modal function domain. They are robust, stochastic search methods modeled on the principles and concepts of natural selection and evolution. The Tutorial will introduce the GA´s themselves and will provide the audience with guidelines for the implementation of successful GA´s. In particular GA´s operators are introduced and their implementation is discussed. Step-by-step procedures are given with associated code to offer the audience the opportunity to try GA´s. Some simple examples for EMC optimization problems are presented, giving hints and suggestions.
T3. EM Simulators Theory and Practice
      (Monday, February 17, 9.00 - 17.00, room F 3)
Lecturer: Prof. W.J.R. Hoefer, University of Victoria, Canada; Dr. D.G. Swanson Jr., Forem, Amesbury, USA
Topics: The proliferation of computer tools for electromagnetic field analysis, design and optimization is having a profound effect on the working environment of EMC engineers. While most practitioners can use such tools after a certain period of training, many remain skeptical as to the trustworthiness of numerical results and hesitate about the limits, errors, and significance of the data generated. The key is to understand what goes on inside these tools and how they solve electromagnetic fields.
The purpose of this tutorial is to provide insight into the operating principles of electromagnetic simulators, and to show how these translate into their properties as engineering tools. The tutorial will be of benefit to:

EMC engineers familiar with linear and non-linear CAD who would like to learn more about field solvers,
Experienced users of electromagnetic simulators who seek a better understanding of their theoretical and computational foundations,
Researchers familiar with computational electromagnetics who would like to learn more about the requirements, concerns and methodology of EMC practitioners.

T4. Reciprocity and EMC Measurements
      (Monday, February 17, 16.30 - 18.00, room F 5)
Lecturer: Dr. Jasper J. Goedbloed, Philips Research, Eindhoven, The Netherlands
Topics: Reciprocity theorems for electrical networks and electromagnetic fields allow us to better understand the mechanisms that play a role in EMC measurements or to facilitate EMC measurements.
This tutorial paper presents the theorems, their accompanying mathematical relations, and quite a number of practical applications that demonstrate the usefulness of these theorems. These applications, particularly of interest to experimentalists and EMC test-house engineers, cover the field of transfer function, filter and conversion measurements, the relevance of antenna factors, probe calibration, aspects of radiated emission in relation to compliance uncertainty and radiated immunity measurements. Also the reciprocity of shielding effectiveness and interference prediction are addressed.

WORKSHOPS

W1. Quantitative Data Comparisons
       (Wednesday, February 19, 9.00 - 12.30, room F 3)
Chairman: Dr. A. Duffy, De Montfort University, Leicester, UK
Contributors: Dr. D. Johns (Flomerics), A. Ruddle, A.J.M. Martin, D.D. Ward (MIRA), C. Jones (BAE Systems), Prof. R. Simpson (Simtronics), D. Coleby (De Montfort University)
Topics: Within the EMC community, the need to compare the results of measurements or predictions is widespread. Such comparisons could be for:

The validation of numerical models, or model implementations, against experimental results.
The assessment of repeatability of measurements whether carried out by the same personnel in the same facilities or different personnel in different facilities.
The assessment of the level of excursion of measurements/models from accepted norms for a given system.
The quantification of changes in measurements or predictions as a result of design or implementation changes.
Traditionally, such comparisons have been carried out by-eye on graphically presented results or acceptability criteria have been based on heuristics determined from significant experience of the system being tested or designed. There does appear to be some movement towards identifying methods to compare such data quantitatively rather than just qualitatively, as such a comparison can minimise latent subjectivity.
The aims of this workshop are:

To provide the EMC community with a forum for the discussion of current research on the topic.
To identify the needs of the EMC community for quantitative comparisons.
To identify application areas where such techniques would be well suited.
To stimulate additional research on this topic and identify other approaches used by industry.

W2. Power Line Communications (PLC)
       (Wednesday, February 19, 14.00 - 17.30, room F 3)
Chairman: Dr. P.A. Beeckman, Philips Digital Systems Laboratory, Eindhoven, Netherlands
Co-chairman: M. Stecher, Rohde & Schwarz, Munich, Germany
Topics: Power Line Communication (PLC) is a new technology that uses existing power network infrastructure for future broadband network services. PLC is considered as an opportunity for both access and in-home networks. The advantage of PLC is that existing power network infrastructure can be used. However, in Europe, EMC is considered as a key risk. Authorities in Germany and the UK require emission limits 20 to 40 dB below the current CISPR 22 emission limits, while the industry even want higher emission limits in order to make broadband services possible. A joint CENELEC/ETSI working group is dealing with the EMC standardization aspects of PLC.
Contributions:

Short introduction of the agenda and the various subjects covered
P.A. Beeckman (Philips Digital Systems Laboratory, Eindhoven, The Netherlands)

Review of EMC mains aspects in fast PLC including some history
D. Hansen (Euro EMC Services, Berikon, Switzerland)

The policies of the European Union on power line communications
Th. Brefort (EC, Brussels, Belgium)

Standardization for EMC compliance of power line communications (PLC)
M. Stecher (Rohde & Schwarz, Munich, Germany)

In-home PLC product opportunities and their EMC aspects
H.D.W. Regtop & Th. Vollmer (respectively Philips Digital Systems Laboratory, Eindhoven, The Netherlands and Philips Research, Aachen, Germany)

Do EMC limits protect broadcasting as intended?
J.H. Stott (BBC, Tadworth, United Kingdom)

PLT access products and their EMC aspects
P.A. Brown (White Box Solutions, Kendal, United Kingdom)

W3. Emission Measurements with Alternative Methods
       (Thursday, February 20, 9.00 - 12.30, room F 3)
Chairman: Prof. H. Garbe, University of Hannover, Germany

Contributors: Prof. H. Garbe, Dr. P. Wilson, M. Heidemann, Dr. C. Holloway, J. Ladbury, G. Koepke

Topics:

Requirements to electromagnetic field tests: Compliance test (OATS), system integration, product specific tasks
Test object size, antenna pattern complexity and implications for emission and immunity testing
Modelling of EuT: Dipole (total radiated power), multipole (near field interaction)
Alternative methods to generate the model: Fully anechoic rooms, reverberation chambers, near field scans, TEM waveguides/TEM cells.

W4. GEMCAR European Project
(Thursday, February 20, 14.30 - 17.30, room F 3)

Chairman: A. Ruddle, MIRA, Nuneaton, United Kingdom

Contributors: . Ruddle (MIRA), I. Hendrikx (Hevrox), Dr. X. Ferrieres, Dr. J.P. Parmentier (ONERA), A. Rubinstein, Dr. F. Rachidi (EPFL), Dr. S. Alestra, Dr. R. Perraud (EADS), Dr. M. Granstrom, M. Theander (Volvo TDC), A. Gunsaya, D. Smythe (Ford Motor Company), F. Subaru, F. Druesne (CETIM), N. Whyman, C. Thomas (QinetiQ)

Topics: GEMCAR (Guidelines for Electromagnetic Compatibility Modelling for Automotive Requirements) is a three-year collaborative research project supported by the EU under the Framework V programme "Competitive and Sustainable Growth". The aim of this project is to generate guidelines concerning applications and methods for modelling vehicle level automotive EMC issues. Nonetheless, these guidelines may well be of interest for other industries and applications. The purpose of this workshop is therefore to present and discuss the results of the project. The workshop will end with an opportunity for further questions and open discussion between the project partners and the audience.

Industrial Forums

Objective: Industrial Forums are a new presentation platform for EMC companies - in particular for the the Symposium Exhibitors - with the objective of providing the attendees some practical and industrial aspects of EMC activities. The planned forums are as follows:

F1. Industrial Forum 1
(Tuesday, February 18, 10.30 - 12.30, room E1.2)

Chairman: Dr. G. Klaus
Contributions:

F1.1 National intercomparison of 100 Accredited EMC Test Laboratories
J. Glimm, M. Spitzer, K. Muenter, L. Dallwitz, Physik.-Techn. Bundesanstalt, Braunschweig; R. Egner, DATech-Geschaeftsstelle, Frankfurt a.M.; L. Dunker, RegTP, Berlin, GermanyGermany

F1.2 An Analysis of Finnish EMC Market Surveillance and Suggestions for its Development
J. Rajamaeki, Safety Technology Authority of Finland/TUKES, Helsinki, Finland

F1.3 Electrical Design and Characterization Methodologies Applied in the Development of FlexBench - a Rapid Prototyping Equipment
F. De Pieri, M. Ferloni, M. Gaio, R. Gemelli, M. Grassi, C. Meani, M. Pavesi, V. Costa, Itatel, Settimo Milanese, Italy

F1.4 Reducing Errors due to Resonances in Radiated and Conducted EMC Testing
R.C. Marshall, Richard Marshall Ltd., Harpenden, United Kingdom

F2. Industrial Forum 2
(Tuesday, February 18, 14.00 - 17.00, room E1.2)

Chairman: M. Nyffeler
Contributions:

F2.1 Comparison of Immunity and Emission Measurements in a Reverb Chamber
G. D´Abreu, ETS-Lindgren, Eura, Finland

Short Description: The purpose of this presentation is to demonstrate the efficiency and repeatability of performing immunity and emission measurements in two reverb chambers of greatly different sizes. The characterization data for both chambers will be presented in addition to the results of an immunity test on a device with known immunity and an emission measurement in the frequency band known to coincide with the emissions from the device. Some data will also be presented from tests done in a GTEM and OATS for reference.

F2.2 Innovation Process Management Towards a Sustainable Portfolio of Safe and Competitive Products
Dr. W.J. Borer, Electrosuisse and Neosys AG, Fehraltorf, Switzerland

Short Description: The innovation process will be described, consisting of the four phases strategy / portfolio, creation of product ideas, product development, and market introduction. Particular emphasis will be put on the aspects of total safety / risks, quality, environmental aspects, and product liability.

F2.3 Ergonomic Manuals for Sustainable Product Safety and Quality
K. Anagnostopoulos, Electrosuisse, Fehraltorf, Switzerland

Short Description: TSM success manuals are based on a new concept by which ergonomic design risk analysis, standards conformity assessment, and usability tests are combined in order to obtain instructions for use (manuals) through which the user of a product / appliance gets easily understandable instructions for a safe and trouble-free use of his product / appliance.

Open Meetings

OA. Open Meetings of URSI Commission E

Organizer:

Commission E WG (Chairmen):

Spectrum Utilization/Management and Wireless Telecommunications. (G. Hurt, USA; R. Struzak, Switzerland)
Intentional Electromagnetic Interference. (M. Wik, Sweden; W. Radasky, USA)
High Power Electromagnetics. (C. E. Baum, R.L. Gardner, USA)
Terrestrial and Planetary Lightning Generation of Electromagnetic Noise. (Z. Kawasaki, Japan; V. Cooray, Sweden)
Interaction with, and Protection of, Complex Electronic Systems. (J. Nitsch, Germany; P. Degauque, France; M. Ianoz, Switzerland, J. P. Parmentier, France)
Effects of Transients on Equipment. (J. ter Haseborg, Germany; V. Scuka, Sweden; B. Demoulin, France)
Extra-Terrestrial and Terrestrial Meteorologic-Electric Environment. (H. Kikuchi, Japan)
Geoelectromagnetic Disturbances and Their Effects on Technological Systems. (M. Hayakawa, Japan, R. Pirjola, Finland)
Interference and Noise at Frequencies Above 30 MHz. (J. Gavan, Israel)

OB. Exposure to GSM Radiation (Tuesday, February 18, 10.30 - 12.30, room F 3)

Organizer:

Research Foundation on Mobile Communication, Zurich, Switzerland

Chairman:

Swiss Federal Institute of Technology , Zurich, Switzerland

Contents:

OC. IARU Open Meeting on EMC Problems Experienced and Caused by Radio Amateurs

Chairman:

OZ8CY

Topics:

Compatibility between shortwave radio reception and the different kinds of digital data communication.
The EU Commission mandate 313 and related topics.
The application of the EMC Directive in interference cases.
Regulation of human exposure to electromagnetic fields.
Other EMC topics of interest for radio amateurs.

Social Program - Tours

Organizer: Mrs. E. Danieli, Zug, Switzerland

Tuesday, February 18:
A welcome tea will be offered to all spouses and guests accompanying conference participants. Information about the tours will be given there.
Meeting point: Fountain in the reception hall, 14.30.

S1: Wednesday, February 19:
Visit of the city of St. Gallen, the metropolitan centre of eastern Switzerland with its cultural attraction - the famous Abbey-District - which was included in the UNESCO list of culture world heritage in 1983. After lunch we see the 150 years old "Chocolate-Land" Maestrani. 8.30 - 16.15.

S2: Thursday, February 20:
Sightseeing tour to Engelberg with the scenic beauty of a high Alpine valley. We visit the Monastery and see cheese being made by hand in the Monastery cheese show factory. After lunch you have time for a short walk in the mountain village. 8.00 - 16.30.

S3: Friday, February 21:
Scenic bus journey through Central Switzerland, along Lake Lucerne. Short city tour of Lucerne and continuation to Kriens, where a cable car takes you to the top of Mt. Pilatus (2132 m / 7000 ft) into a mystical, white winter paradise. According to the legend, kind dragons used to inhabitate this mountain! Discover the Dragon Path and enjoy the spectacular panorama (if there is nice weather). Lunch on Mount Pilatus.

S4: Friday and Saturday, February 21 - 22:
Ride to Interlaken and Grindelwald, enjoy nature or even wintersports (all equipment may be rented). Overnight in Interlaken, scenic train journey over the Kleine Scheidegg to Lauterbrunnen and Mürren, top of Schilthorn (2970 m) with a fine meal in the revolving restaurant.

Individual postconvention tours to excellent wintersport resorts may be organized either in advance (contact the Organizing Committee) or at the Symposium Information Desk. For the excursions S3 and S4 contact the Information Desk not later than Wednesday, Feb. 19, 13.00. Minimum participance 20 persons. Bus departure from Symposium building, underground passage. Please register as soon as possible (limited participance).

Technical Excursions

The following parallel visits are planned for Friday, February 21

E1: Logitech SA, Romanel-sur-Morges
Logitech is a leader of innovation and design in human computer interface devices. Visit of the product development laboratories for all kind of cordless devices, near to the Lake Geneva. Lunch is provided. Friday, Feb. 21, 8.00 - 18.00.

E2: EM Microelectronic, a Swatch Group Company in Marin
EM Marin is a semiconductor manufacturer that designs and produces ultra low power, low voltage, digital, analog and mixed ICs. Includes a visit of the production facilitiy. Lunch is provided. Friday, February 21, 8.00 - 17.00.

Bus departure from Symposium building, underground passage. Since the number of places are limited, confirm your advance registration at the Information Desk until Wednesday, February 19, 13.00 !

Technical Exhibition

Exhibition Chairman: Dr. H. Kramer, IKT ETH , Zurich, Switzerland
The exhibition area, located adjoining the session rooms, will be open daily (February 18 - 20) from 9.30 till 18.00 except on Thursday, when it closes at 16.30. An exhibition catalogue will be made available. Access to the exhibition is free.

For information concerning the exhibition see the exhibiters web-page or contact the Organizing Committee


PROVISIONAL LIST OF EXHIBITORS
(As of January 22, 2003)

AGILENT TECHNOLOGIES AG Switzerland
Albatross Projects GmbH Germany
Amplifier Research Corp. USA
ARC Seibersdorf Research GmbH Austria
Baer + Mettler AG Switzerland
CST Germany
EM Software & Systems - SA (Pty) Ltd. South Africa
EM Test AG Switzerland
EMC PARTNER AG Switzerland
Emerson & Cuming Belgium
Emitec AG Switzerland
eTS-Lindgren USA
Fischer Custom Communications INC. USA
Haefely EMC Switzerland
Huber + Suhner AG Switzerland
IEEE EMC SOCIETY USA
Jaquier EMC Service SA/AG Switzerland
LECROY SA Switzerland
Luethi Elektronik - Feinmechanik AG Switzerland
Meteolabor Ag Switzerland
Montena EMC SA Switzerland
narda Safety Test Solutions GmbH Germany
Network Technology Ltd. Ukraine
PMM S.r.l. Italy
PRANA France
Rohde & Schwarz GmbH & Co KG Germany
Schaffner EMC AG Switzerland
Sibalco, W. Siegrist & Co. AG Switzerland
Siepel France
SimLab Software GmbH France
Spitzenberger + Spies GmbH Germany
Telemeter Electronic GmbH Switzerland

Last update: January 26, 2009

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