Proceedings EMC Zurich '99 Table of Contents

A. Protection and Mitigation

• 1A1 A. Beggio, Politecnico di Torino; G. Borio, Camera Commercio, Torino; R.E. Zich, Politecnico di Milano, Italy: Analysis and experimental validation of the shielding performances of complex chiroshields for EMC applications.
• 2A2 J.L. Knighten, NCR Corp., San Diego; L.O. Hoeft, Albuquerque; S. Radu, SUN Microsystems, Palo Alto; M. Xu, J.L. Drewniak, University of Missouri-Rolla, Rolla, USA: Observed shielding variations in cable assemblies intended for differential signaling of 1.0625 gigabit/second data rates.
• 3A3 P. Hasse, J. Birkl, Dehn + Soehne, Neumarkt, Germany: EMC-based lightning protection concept: Surge protection in existing structures.
• 4A4 Ch. Drilling, M. Droldner, E.G. Jordan, J.M. Meppelink, BET, Menden, Germany: A new generator for testing of SPD´s using multiple lightning current impulses for combined tests with follow currents.
• 5A5 Z. Hrytskiv, Lvivska Polytechnika, Lviv, Ukraine: A generalised view of the problem of EMC for cathode ray tubes.

B. EMC Management

• 6B1 F.B.J. Leferink, D.J. Groot Boerle, Hollandse Signaalapparaten, Hengelo, Netherlands: A proper framework for EMC standards.
• 7B2 P. Miller, Motorola, Stotfold, England: An approach to production conformance testing for parts of large systems.
• 8B3 U. Slansky, Dornier Satellitensysteme, Friedrichshafen, Germany; D. Baynes, Alenia Spazio, Torino, Italy: Cost effective EMC verification testing in the satellite industry.
• 9B4 A.A. Povarov, Ju.M. Chudnyi, M.M. Gromov Flight Research Institute, Zhukovsky, Russia; V.A. Zaika, National Academy of Science of Belarus, Minsk, Belarus: Complexed probabilistic-statistical evaluation of civil aerotechnics electromagnetic compatibility and safety.
• 10B5 H.R. Hofmann, Lucent Technologies, Naperville, USA: On-site measurements and mitigation of emissions from a telecom central office.

• 11C1 A. N. Volobuev, E. L. Ovchinnikov, Samara Medical University, Samara, Russia: Electromagnetic modeling of the nerve system.
• 12C2 J. Wang, O. Fujiwara, Nagoya Institute of Technology, Nagoya, Japan: Reduction of SAR in human head by suppression of surface currents due to a portable telephone.
• 13C3 A. Karwowski, Silesian Technical University, Gliwice, Poland: Effects of the presence of a human operator on the folded loop antenna for mobile hand-held units.
• 14C4 P. Bertotto, A. Schiavoni, CSELT, Torino; G. Cerri, P. Russo, G. Tribellini, University of Ancona, Italy: A MOM/FDTD hybrid method for the evaluation of the EM fields in penetrable objects.
• 15C5 B. Eicher, Swisscom, Berne, Switzerland: Bioelectromagnetics: The gap between scientific knowledge and public perception.

D. ESD and Fast Transients

• 16D1 D. Pommerenke, Hewlett Packard, Roseville, USA: ESD: What has been achieved, what is less well understood?
• 17D2 G. Cerri, R. De Leo, V. Mariani Primiani, M. Palmucci, University of Ancona, Italy; A. Ciccolella, ESA-ESTEC, Noordwijk, Netherlands: Electromagnetic interference induced on a transmission line by an electrostatic discharge inside metallic enclosures.
• 18D3 E. Cardelli, University of Perugia; B. Tellini, Pisa University, Pisa, Italy: Studies about human electrostatic discharges.
• 19D4 S. Ishigami, J. Otonari, T. Iwasaki, University of Electro-Communications, Tokyo, Japan: Measurement of the break-down voltage in a very-small gap discharge.
• 20D5 J. Catrysse, Katholieke Hogeschool, Oostende; M. Catrysse, KU Leuven, Belgium: The characterisation of antistatic materials: an alternative approach.
• 21D6 S. Frei, M. Senghaas, W. Kalkner, Technical University of Berlin, Germany; R. Jobava, Tibilisi State University, Georgia: The influence of speed of approach and humidity on the intensity of ESD.

E. EMC in Extended Systems I: Theory and Modeling

• 22E1 J.P. Parmantier, ONERA, Meudon, France: Theory and modeling for EMC in extended systems: current capabilities and requirements.
• 23E2 M.M. Al-Asadi, A.P. Duffy, De Montfort University, Leicester; A.J. Wills, BICC Brand-Rex, Warrington; K. Hodge, BICC Brand-Rex, Fife, United Kingdom: Analysing link performance in high frequency transmission systems.
• 24E3 A. Maffucci, G. Miano, Universita di Napoli "Federico II", Napoli, Italy: A new method to evaluate the impulse responses of lossy multiconductor transmission lines.
• 25E4 P. Czarnywojtek, W. Machczynski, Poznan University of Technology, Poland: Simulation of coupling to underground cables caused by higher frequency components of power line transients.
• 26E5 C. E. Baum, Air Force Research Lab., Kirtland AFB, USA: Generalization of the BLT equation.
• 27E6 J.P. Parmantier, X. Ferrieres, S. Bertuol, ONERA, Meudon, France; C.E. Baum, Air Force Research Lab., Kirtland AFB, USA: Optimization of the BLT equation based on a sparse Gaussian elimination.

• 28F1 H. Garn, Austrian Research Center, Seibersdorf, Austria: Advances in antenna calibration.
• 29F2 S. Lihua, Z. Bihua, T. Baoqi, Nanjing University, Nanjing, China: A discrete transfer function model for the time-domain calibration data of EMP sensors.
• 30F3 W. Muellner, M. Buchmayr, Austrian Res. Center Seibersdorf, Austria: Introducing height correction factors for accurate measurements with biconical antennas above groundplane.
• 31F4 J.D. Norgard, University of Colorado, Colorado Springs; C. Stubenrauch, NIST, Boulder; J. Will, SUN Microsystems, Mountain View, USA: Measurement of antenna patterns using microwave/ infrared holography.
• 32F5 K. Muenter, R. Pape, M. Spitzer, J. Glimm, PTB, Braunschweig; M. Nouri, Mikes Product Service, Strasskirchen, Germany; T. Schrader, EMC Test Systems, Austin, USA: Traceable measurement of horn antenna gain at short distances using the "21/2-antenna-method".
• 33F6 M.J. Alexander, National Physical Laboratory, Teddington, United Kingdom: The measurement and use of free-space antenna factors in EMC applications.

• 34G1 J.-L. ter Haseborg, L. Jung, T. Weber, Technical University Hamburg-Harburg, Hamburg, Germany: Transients: measurement, simulation and protection.
• 35G2 S. Lindenmeier, L. Pierantoni, P. Russer, Technical University Muenchen, Germany: Efficient time domain modeling of EM coupling between metallic enclosures.
• 36G3 D. Orzan, M. Ianoz, Swiss Federal Institute of Technology, Lausanne, Switzerland; B. Nicoara, University "Politecnica", Bucarest, Romania: Response of shielded cables to an external electromagnetic field excitation. Modeling and experimental validation.
• 37G4 A. Galvan, V. Cooray, Uppsala University, Uppsala, Sweden: Lightning induced voltages on bare and insulated buried cables.
• 38G5 G. Lucca, SIRTI S.p.A., Milano, Italy: Radiation from a traction line due to arcs between a pantograph and the contact wire.
• 39G6 J. LoVetri, University of Western Ontario, London, Canada; A.T.M. Wilbers, A.P.M. Zwamborn, TNO Physics and Electronics Laboratory, The Hague, Netherlands: Microwave interaction with a personal computer: Experiment and modeling.
• 40G7 T. Krauss, W. Koehler, K. Feser, University of Stuttgart, Ostfildern, Germany: Optimization of a large field simulator by transient field calculations and measurements.
• 41G8 I. Mueller, F. Noack, M. Schneider, Technische Universitaet Ilmenau, Germany: Using GTEM-cells for time domain measurements.

• 42H1 P. Regli, A. Witzig, W. Fichtner, Swiss Federal Institute of Technology, Zurich, Switzerland: Coupled simulation of nonlinear devices and electromagnetic effects.
• 43H2 J.R. Bergervoet, R. Rietman, Philips Research Laboratories, Eindhoven, Netherlands: Combined modelling of ICs, packages and PCBs using analytical equivalent-circuit approximations.
• 44H3 F.B.M. van Horck, Philips Components; A.P.J. van Deursen, P.C.T. van der Laan, Eindhoven University of Technology, Eindhoven, Netherlands: Common-mode currents and printed circuit boards.
• 45H4 B. Archambeault, IBM Personal Systems, Research Triangle Park; A. Ruehli, IBM Research, Yorktown Heights, USA: Electrical package modeling including voltage and ground reference planes using the Partial Element Equivalent Circuit (PEEC) method.
• 46H5 M. Troescher, Sim Lab Software; M. Klamet, Siemens, Munich, Germany: Reduction of complexity when simulating large-scale PCB circuits.
• 47H6 S. Cristina, University of Roma "La Sapienza", Rome; G. Antonini, A. Orlandi, University of L´Aquila, Italy: Three dimensional model for conductive enclosures with apertures and attached cables.
• 48H7 M. Leone, H. Bruens, H. Singer, Technical University of Hamburg-Harburg, Hamburg, Germany: Fast susceptibility analysis for printed circuit boards using an equivalent-wire method of moments.
• 49H8 P. Kralicek, University of Paderborn; F. Sabath, Federal Office of Defence Technology and Procurement, Koblenz; H. Garbe, University of Hannover, Germany: Validation of a hybrid MoM-MTL method calculating complex structures on PCBs.

I. Measurement Technology I

• 50I1 B. Audone, Alenia Aerospazio (SIEL), Torino, Italy: Measurement technology developments in test methods and environment.
• 51I2 M.J. Alexander, National Physical Laboratory, Teddington, United Kingdom: Development of new measurement methods and limits for EMC compliance testing in smaller relative inexpensive fully anechoic rooms.
• 52I3 L. Dawson, J.F. Dawson, A.C. Marvin, University of York; D. Welsh, York EMC Services, York, United Kingdom: Design and testing of partially lined screened rooms.
• 53I4 J. Welinder, J. Carlsson, Swedish Nat. Testing & Res. Inst., Boras; L. Hasselgren, IVF, Moelndal, Sweden; E. Rodriguez, Labein, Zamudio, Spain: Simulated behaviour of fully anechoic rooms for measurement of radiated emissions.
• 54I5 T.A. Laitinen, P. Vainikainen, Helsinki University of Technology, Espoo, Finland: Determination of the uncertainty of the radiated EMI predicted by measuring the absolute value of a magnetic near field.
• 55I6 A.R. Ruddle, D.A. Topham, D.D. Ward, MIRA, Nuneaton; P.J. Page, Ford Motor Company, Basildon, United Kingdom: Theoretical investigation of automotive emissions measurements at 3 m and 10 m ranges.
• 56I7 D. Pommerenke, Hewlett Packard, Roseville, USA: A comparison of methods to evaluate RF absorbers between 30 MHz and 500 MHz before and after installation.

J. Power System EMC

• 57J1 S. Celozzi, M. D´Amore, University of Rome "La Sapienza", Rome, Italy: Shielding performance of power cables with low magnetic field emission.
• 58J2 B.W. Jaekel, A.B. Mueller, Siemens Automation and Drives, Erlangen, Germany: Transients on secondary equipment in medium voltage switchgear installations.
• 59J3 I. Fofana, A. Beroual, CEGELY, Ecully, France: Studying positive lightning induced effects on a very close power distribution line.
• 60J4 H. Ohashi, Y. Kobayashi, K. Murakawa, T. Kishimoto, NTT Corp., Tokyo; H. Kijima, Polytechnic University, Kanagawa, Japan: A new earth resistance measurement method using a resonant circuit.
• 61J5 E. Hoene, A. Simsek, H. Reichl, Fraunhofer Institut IZM, Berlin, Germany: Simulation of conducted electromagnetic interference of inverter-fed induction motors.
• 62J6 C. Imposimato, CESI, Milano; L. Pandini, ENEL SRI PEA, Cologno Monzese; E. Bottari, CISAM, S. Piero a Grado, Italy; L. Inzoli, ESA-ESTEC, Noordwijk, Netherlands: Evaluation of the radiated lightning coupling on real MV power lines by an EMP simulator.
• 63J7 D. Heyder, R. Doebbelin, H. Mecke, R. Neumann, Otto-von-Guericke-Univ., Magdeburg, Germany: EMC-aspects of resistance welding machines.

K. Numerical Methods

• 64K1 R. Vahldieck, Federal Institute of Technology, Zurich, Switzerland: New developments in computational electromagnetics for EMC problems.
• 65K2 M. Ney, S. Le Maguer, ENST de Bretagne, Brest, France: Diakoptics: An efficient technique for EMC applications.
• 66K3 J. Paul, C. Christopoulos, D.W.P. Thomas, University of Nottingham, UK: Equivalent circuit models for the time-domain simulation of ferrite electromagnetic wave absorbers.
• 67K4 C.J. Macdonald-Bradley, P. Jennings, R. Ball, P. Lever, S. Baker, University of Warwick, Coventry, UK: The effects of cell size on FDTD calculations for cubic structures.
• 68K5 A.C. Cangellaris, C. Jin, University of Illinois, Urbana, USA: Macro-elements for accurate dispersive modeling of thin material sheets and impedance boundary conditions in FDTD.
• 69K6 D.M. Correia, Escola Politecnica da USP, Sao Paulo, Brazil; H. Singer, TU Hamburg-Harburg, Hamburg, Germany: A MoM solution for the EFIE applicable to any combination of thin-wire and surface scatterers down to low frequencies.
• 70K7 M. Li, S. Radu, Sun Microsystems, Palo Alto; J.L. Drewniak, T.H. Hubing, T.P. VanDoren, R.E. Du- Bruff, University of Missouri-Rolla, Rolla, USA: An EMI estimate for shielding enclosure design.
• 71K8 J. Nicolai, K.-H. Gonschorek, Dresden University of Technology, Dresden, Germany: Application of new spline-based expansion and weighting functions for the analysis of complex thin-wire structures.
• 72K9 S. Tkachenko, G. Vodopianov, Radio Research Institute (NIIR); L. Martinov, Committee for Communications and Informatics, Moscow, Russia: Electromagnetic field coupling to an electrically small antenna in a rectangular cavity.

• 73L1 P. Beeckman, Philips Research, Eindhoven, Netherlands: Practical aspects of EMC in extended systems: An overview.
• 74L2 M. T. Zhang, Intel Corp., Hillsboro, USA: Spread spectrum clocking and its timing impacts.
• 75L3 L. Halme, M. Nupponen, V. Naessi, Helsinki University of Technology, Espoo; R. Kytoenen, Sonera Corp., Sonera, Finland: Effects of connecting hardware and terminals on the screening, crosstalk and transmission properties of an over 100 MHz data link.
• 76L4 F. Moulin, R. Tarafi, O. Daguillon, A. Zeddam, France Telecom, Lannion, France: Influence of electromagnetic disturbances induced on high bit rate transmission systems.
• 77L5 J.M. van den Elzen, VDO Car Communication, Eindhoven, Netherlands: Susceptibility of car radios to ignition noise.
• 78L6 S. Ficheux, Y. Lerasle, E. Pretet, C. Corsi, UTAC, Montlhery; M. Klingler, INRETS-LEOST, Villeneuve d´Ascq, France: Results of a round robin test performed in different automotive EMC vehicle chambers.
• 79L7 C.F. Post, Lambda Engineering, Loenen, Netherlands: EMC-aspects of industrial data communication networks.
• 80L8 A. Pleym, Norvegian University of Science and Technology, Trondheim, Norway: EMC in railway systems: Conductive coupling from track to nearby metallic structures.

• 81M1 M. Kane, Canadian Standards Association, Toronto, Canada; Ph. Auriol, L. Kraehenbuehl, F. Buret, CEGELY, Ecully, France: New frequency-dependent models for close-spaced multiwire lines over a conducting plane.
• 82M2 E. Clavel, J. Roudet, J.-L. Schanen, Laboratoire d´Electrotechnique de Grenoble, St. Martin d´Heres, France: A multiconductor transmission line method to study non-perfect ground planes.
• 83M3 S.K. Lee, M. Hayakawa, University of Electro-Communications, Tokyo; K. Baba, Chubu University, Kasugai Aichi, Japan: The combined use of FEM and IEM for predicting crosstalk in transmission lines.
• 84M4 N.V. Korovkin, S.V. Kotchetov, E.E. Selina, State Technical University, St. Petersburg, Russia; M. Ianoz, Swiss Federal Institute of Technology, Lausanne, Switzerland: Simulation of the frequency characteristics of transmission lines for transient calculations.
• 85M5 S. Grivet-Talocia, F. Canavero, Politecnico di Torino, Turin, Italy: A transient solution for nonuniform multiconductor transmission lines in external fields.
• 86M6 M. Rubinstein, Swisscom, Berne, Switzerland: Effect of wire radii tolerances on differential to common mode conversion in balanced twisted pairs.
• 87M7 J.A. Roden, IBM Personal Systems, Research Triangle Park; S.D. Gedney, University of Kentucky, Lexington, USA: Analysis of the propagation and radiation of a twisted-pair transmission line using the non-orthogonal FDTD technique (NFDTD).
• 88M8 Z. Nadir, F. Pezin, L. Kone, B. Demoulin, University of Lille, Villeneuve d´Ascq, France: Experimental description of electromagnetic coupling occurring on transmission lines at high frequencies (300 MHz - 10 GHz).

• 89N1 A. Orlandi, University of L´Aquila, Italy: Topics in EMC innovation.
• 90N2 M. D´Amore, M.S. Sarto, University of Rome "La Sapienza", Rome, Italy: Diagnostics of signal transmission lines by using a neural network based monitoring of the radiated emission.
• 91N3 G. Antonini, University of L´Aquila; S. Cristina, University of Rome "La Sapienza", Rome, Italy: Performance analysis of electromagnetic shields using neural networks.
• 92N4 R. De Leo, V. Mariani Primiani, D. Ottaviani, University of Ancona, Italy: A test method for immunity of radio-linked automation systems.
• 93N5 S. Pignari, Politecnico di Milano, Milan; F. Canavero, Politecnico di Torino, Turin, Italy: Numerical simulation of EMC tests for compliance.
• 94N6 S. Salio, F. Canavero, Polytechnic of Turin, Italy; J. Lefebvre, Thomson-CSF Communication, Colombes; W. Tabbara, LSS/CNRS-SUPELEC, Gif-sur-Yvette, France: Statistical description of signal propagation on random bundles of wires.
• 95N7 F. Chiaraluce, R. De Leo, E. Gambi, P. Pierleoni, University of Ancona, Italy: Statistical considerations on electrical fast transient/burst immunity tests.
• 96N8 B. Audone, A. Lamprati, Alenia Aerospazio (SIEL), Turin, Italy: The use of statistical signal processing in EMC.

O. Measurement Technology II

• 97O1 S.B. Worm, Philips Research, Eindhoven, Netherlands: On the relation between radiated and conducted RF emission tests.
• 98O2 E.L. Bronaugh, Siemens Information and Communication Products, Austin, USA: Mains simulation network (LISN or AMN) uncertainty - how good are your conducted emission measurements?
• 99O3 M. Netzer, RAFAEL, Haifa, Israel; V. Smith, W. Fenstermacher, R & B Enterprises, West Conshohocken, USA: Comparison of couplers used for cable injection in commercial and military susceptibility tests: capacitive versus inductive coupling methods.
• 100O4 T. Haehner, Alcatel, Nuernberg; B. Mund, BEDEA, Asslar, Germany: Test methods for screening and balance of communication cables.
• 101O5 S. Helmers, K.-H. Gonschorek, Dresden University of Technology, Dresden, Germany: Evaluation of the coupling into cables through shield discontinuities.
• 102O6 R. Kobayashi, M. Hattori, NTT Tech. Ass. & Supp. Center; K. Tajima, Y. Hiroshima, N. Kuwabara, NTT Multimedia Networks Laboratory, Tokyo, Japan: Capacitive voltage probe for non-contact measurement of common-mode voltage.
• 103O7 T. Miyakawa, Y. Tokano, Y. Hotta, Y. Sato, M. Kondo, Tokin Co., Tsukuba, Japan; K. Petermann, Technical University Berlin, Germany: Development of a practical optical electric field sensor in GHz range.
• 104O8 K. Tajima, N. Kuwabara, NTT Multimedia Networks Lab.; R. Kobayashi, NTT Technical Assistance and Support Center, Tokyo, Japan: An improved broad-band isotropic E-field sensor using Mach-Zehnder interferometers.

P. Lightning Physics and Effects

• 105P1 V. Rakov, University of Florida, Gainesville, USA: Lightning electric and magnetic fields.
• 106P2 C. Gomes, V. Cooray, Uppsala University, Sweden: The dependence of the leader and return stroke field changes on the orientation of a segment of the leader channel.
• 107P3 J.M. Cvetic, B.V. Stanic, University of Belgrade, Yugoslavia; F. Heidler, Federal Armed Forces University, Neubiberg, Germany: Properties of the channel discharge function in the generalized lightning travelling current source return stroke model.
• 108P4 N.I. Petrov, G.N. Petrova, All-Russian Electrotechn. Institute, Istra, Russia: Physical mechanisms of high-frequency electromagnetic field generation by a lightning discharge.
• 109P5 V. Amoruso, F. Lattarulo, Politecnico di Bari, Italy: A cascade of tapered transmission lines for lightning return-stroke modeling.
• 110P6 R.E. Zich, Politecnico di Milano, Milan; G. Vecchi, M. Sala, F.C. Canavero, Politecnico di Torino, Turin, Italy: Return-stroke radiation by a branched channel: A transmission line discharge model.
• 111P7 B. Kordi, R. Moini, S.H.H. Sadeghi, Amirkabir University of Technology, Teheran, Iran: Comparison of the transmission line coupling model with the EFIE approach for lightning induced overvoltage prediction.
• 112P8 A.M. Ramli, Telecom Malaysia, Serdang; H. Ahmad, T. Tamsir, N. Othman, Universiti Teknologi Malaysia, Skudai, Malaysia; H. Satoh, NTT, Tokyo, Japan: Measurement of induced surges on telecommunication subscriber cables due to nearby lightning discharge: Basis for standard development.
• 113P9 J.C. Chai, A.O. Britting Jr., S. Monos, J.L. Montegut, The Aerospace Corporation, Los Angeles, USA: A lightning data survey and parameters in retest criteria.

Q. Board and Chip-Level EMC II: Practical

• 114Q1 R. Demoor, Texas Instruments, Houston, USA; J. C. Perrin, Texas Instruments, Villeneuve Loubet, France: Integrated circuit design for reduced EMI.
• 115Q2 A.C. Cangellaris, University of Illinois, Urbana; A. Ruehli, IBM Research, Yorktown Heights, USA: A partitioning based approach for a card in enclosure problem.
• 116Q3 G. Masetti, N. Speciale, University of Bologna; G. Setti, University of Ferrara, Italy: On the key role of parasitic capacitances in the determination of the susceptibility to EMI of integrated operational amplifiers.
• 117Q4 G. Akoun, C. Tavernier, I. Terrasse, M. Weinachter, Aerospatiale, Suresnes, France: Presentation of a hybrid code for EMC simulation of electronic boards.
• 118Q5 N. Ishibashi, S.K. Lee, M. Hayakawa, University of Electro-Communications, Tokyo, Japan: Numerical study of the radiation from a bend in a transmission line.
• 119Q6 L.P. Janssen, Philips Consumer Electronics, Eindhoven, Netherlands: Reducing the emission of multi-layer PCBs by removing the supply plane.
• 120Q7 T.R. Gazizov, N.A. Leontiev, Tomsk State University of Control Systems & Radioelectronics, Tomsk, Russia: Compensation of far-end crosstalk in interconnects of a double-layered dielectric PCB.
• 121Q8 M. Lubineau, I.E.R.S.E.T.; E. Sicard, INSA-DGEI; C. Huet, Aerospatiale; J.C. Pourtau, ALCATEL; S. Ollitrault, Motorola; Ch. Marot, Siemens Automotive, Toulouse, France: On the measurement of EMC in integrated circuits.

R. EMC Test Chambers

• 122R1 M. Koch, C. Groh, H. Garbe, Univ. of Hannover, Germany: Exact determination of resonant frequencies in TEM cells.
• 123R2 A. Nothofer, A.C. Marvin, J.F. Dawson, University of York, Heslington, UK: Indirect measurement of field uniformity in TEM cells including cross-polar field components.
• 124R3 M. Klingler, J. Rioult, J.-P. Ghys, INRETS-LEOST, Villeneuve d´Ascq; S. Ficheux, UTAC, Montlhery, France: Wide-band total radiated power measurements of electronic equipment in TEM and GTEM cells.
• 125R4 G. d´Amore, L. Anglesio, A.R.P.A. Piemonte, Ivrea; S. Adda, G.C. Bonazzola, University of Turin, Italy: A procedure for evaluating the reflectivity level of anechoic chambers based on numerical simulations.
• 126R5 F. Voelgyi, L. Nyul, Techn. University of Budapest; S. Tatar, A. Mrovcza, TKI, Budapest, Hungary: A new radio frequency absorber for GTEM cell applications.
• 127R6 M. Petirsch, I. Sotriffer, A. Schwab, University of Karlsruhe, Germany: Mode-stirred chamber as test facility for electromagnetic susceptibility measurements.
• 128R7 A.P. Duffy, A.J.M. Williams, De Montfort University, Leicester, United Kingdom: Optimising mode stirred chambers.
• 129R8 P. Corona, G. Ferrara, M. Migliaccio, Instituto Universitario Navale, Napoli, Italy: A stochastic approach for determining the reverberating chamber quality factor.