A. Standards

• A1 M. R. W. Van den Bergh, Thermo Voltek Corp., Lowell, USA: Harmonic content analysis by IEC-1000-3-2.
  
• A2 J. Dansou, R. Weber, Antenne Universitaire de Blois; Y. Raingeaud, J. Baillou, L.E.I. de l'Universite de Tours, France: Capacitive clamp used in standards; analysis of test method and new results.
  
• A3 J. Dansou, R. Weber, Antenne Universitaire de Blois; Y. Raingeaud, J. Baillou, L.E.I. de l'Universite de Tours, France: Electromagnetic effects of GSM on motor vehicles and their standards.
  
• A4 R. Harms, Daimler-Benz Aerospace, Bremen, Germany: Let's make the compatibility requirements compatible.
• A5 M. B. Azevedo, IBM, Hortolandia, Brazil: Present and future status of EMC in Brazil and South America.
  
  
B. Component and subcircuit EMC

• B1 M. J. Coenen, Philips Semiconductor, Eindhoven, Netherlands: On-chip measures to achieve EMC.
  
• B2 J. Ben Hadj Slama, G. Rojat, Ph. Auriol, CEGELY, Ecully, France: Using the moment method for modelling the electromagnetic field radiated by static converters.
  
• B3 J. Rahbek, Teledanmark, Taastrup, Denmark: Comparison of the RF immunity of operational amplifiers.
  
• B4 Y. Hattori, H. Hayashi, T. Kato, H. Tadano, H. Nagase, Toyota Central R & D Labs., Nagakute, Aichi, Japan: Simulation of undesired behavior of analog circuits under RF injection.
  
• B5 R. Vick, EMV-Beratung & -Planung; E. Habiger, University of Technology, Dresden, Germany: Evaluation of microcontroller susceptibility to impulsive electromagnetic disturbances.
  
  
C. Lightning and its effects, part I

• C1 V. A. Rakov, University of Florida, Gainesville, USA: Lightning electromagnetic fields: Modeling and measurements.
  
• C2 G. Vecchi, R. E. Zich, F. C. Canavero, Politecnico di Torino, Italy: A study of the effect of channel branching on lightning radiation.
  
• C3 R. Thottappillil, Uppsala University, Sweden; M. A. Uman, V. A. Rakov, University of Florida, Gainesville, USA: Comments on the significance of retardation effects in calculating the radiated electromagnetic fields from an extending discharge.
  
• C4 J. M. Cvetic, B. V. Stanic, University of Belgrade, Yugoslavia: LEMP calculation using an improved return stroke model.
  
• C5 M. Hayakawa, University of Electro-Communication, Tokyo; K. Ohta, Chubu University, Aichi, Japan: ELF tweeksferics: Direction finding, propagation mechanism and location of lightning discharges.
  
  
D. Electrostatic discharge TUa

• D1 S. Wendsche, TU Dresden, Germany: Improving the statistical evaluation of immunity to electrical transients.
  
• D2 F. Chiaraluce, R. De Leo, E. Gambi, University of Ancona, Italy: Full statistical analysis of an ESD environment.
  
• D3 G. Stricker, University of Dortmund, Germany: Investigation of the disturbance fields of partial discharges in elementary high voltage setups.
  
• D4 K. E. Hall, HP, Roseville; D. McCarty, HP, Santa Rosa; D. Dale, HP, Ft. Collins; D. Smith, Auspex Sys., Santa Clara; J. Nuebel, Sun Microsystems, Mountain View; J. Barth, Barth Electronics, Boulder City; H. Hyatt, Hyger Physics, Camarillo, USA: Steps taken to determine why different IEC 801.2 ESD simulators produce different results.
  
• D5 R. Jabova, D. Karkashadze, P. Shubitidze, R. Zaridze, G. Bit-Babik, Tibilisi State University, Georgia; D. Pommerenke, Technical Univ. of Berlin; M. Aidam, Technical Univ. of Munich, Germany: Computer simulation of ESD.
  
• D6 R. A. Green, R. S. Axley, McDonnell Douglas Aerospace, Huntsville, USA: Electrostatic discharge in fluid lines in the petroleum and aerospace industry.
  
  
E. System EMC and radio communications

• E1 Z. D. Grytskiv, S. V. Voloshynovskiy, State Univ. "Lvivska Politechnika", Lviv, Ukraine: Enhancement of the immunity of a radiometry imaging system against high energy disturbances.
  
• E2 V. G. Bezrodny, P. V. Ponomarenko, Y. M. Yampolski, Nat. Acad. of Sciences of Ukraine, Kharkov, Ukraine: Ionospheric scattering of broadcast signals as a source of stochastic interference to highly sensitive HF radio systems.
  
• E3 R. A. Leese, Mathematical Institute, Oxford, United Kingdom: A fresh look at channel assignment in uniform networks.
  
• E4 R. A. H. Gower, R. A. Leese, Mathematical Institute, Oxford, England: The sensitivity of channel assignment to constraint specification.
  
• E5 F. M. Tesche, EMC Consultant, Dallas, USA; A. W. Kaelin, M. Nyffeler, B. R. Braendli, Defence Procurement Agency, Spiez, Switzerland: Representation of wideband spectra using an adaptive, nonuniform sampling scheme.
  
• E6 J. Perini, Syracuse University, New Smyrna Beach; L. S. Cohen, Naval Research Laboratory, Washinton DC, USA: How to decide the minimum number of frequency samples for compliance testing.
  
  
F. Lightning and its effects, part II

• F1 R. Moini, B. Kordi, Amirkabir University of Technology, Teheran, Iran; V. A. Rakov, M. A. Uman, University of Florida, Gainesville, USA: An antenna theory model for the lightning return stroke.
  
• F2 I. Fofana, A. Beroual, Ph. Auriol, A. Ben Rhouma, CEGELY, Ecully, France: A model of the positive lightning stepped leader and its radiated electromagnetic fields.
  
• F3 A. Xemard, J. Michaud, H. Rochereau, Electricite de France, Clamart; R. Tarafi, A. Thomas, O. Daguillon, A. Zeddam, France Telecom, Lannion, France: Modelling and statistical analysis of the lightning effects on electricity supply and telecommunication lines.
  
• F4 C. Gomes, R. Thottappillil, V. Scuka, Uppsala University, Sweden: Bipolar electric field pulses in lightning flashes over Sweden.
  
• F5 F. Fuchs, Fed. Armed Forces Univ. Munich, Neubiberg, Germany: Results of the simultaneous lightning current and LEMP-measurements at the Peissenberg.
• F6 V. V. Borisov, I. I. Kononov, I. E. Usupov, St. Petersburg Univ., Russia: Space structure of the magnetic field component for geometrically different types of lightnings.
  
  
G. EMC instrumentation and measurement

• G1 D. R. Bush, Lexmark International, Lexington, USA: A brief history of EMC measurements.
  
• G2 E. L. Bronaugh, EdB EMC Consultants, Austin, USA: Uncertainty of the frequency spectra produced by a reference radiator.
  
• G3 G. Monien, H. Singer, TU Hamburg-Harburg, Germany: Measurement error and field distortion of magnetic field sensors.
  
• G4 A. Sugiura, Communications Research Laboratory, Tokyo; A. Maeda, Maeda Associates, Yokohama; N. Kuwabara, NTT Telecommunication Networks Laboratories; S. Usuda, Vol. Control Council for Interference, Tokyo, Japan: Site attenuation measurements using shortened dipole antennas.
  
• G5 R. Kobayashi, N. Kuwabara, NTT Multimedia Networks Lab.; M. Hattori, NTT Technical Assistance, Tokyo, Japan: A method for determining the transmission direction of commonmode electromagnetic noise by measuring its energy flow.
  
• G6 V. Korepanov, R. Berkman, F. Doudkin, Nat. Academy of Science of Ukraine, Lviv, Ukraine: Low frequency gradientometer for EMC certification.
  
• G7 D. Golzio, Munich, Germany: Crest factor sensor for electromagnetic fields.
  
• G8 F. Gassmann, EMC Baden, Switzerland: A 9 channel photonic isotropic electric and magnetic field sensor for subnanosecond rise times.
  
  
H. Shielding

• H1 S. Criel, R. De Smedt, Alcatel Bell Research Div., Antwerpen; E. Laermans, F. Olyslager, D. De Zutter, INTEC-University of Gent; N. Lietaert, A. De Clercq, Barco N. V. Kortrijk, Belgium: Theoretical and experimental determination of the shielding effectiveness of test enclosures.
  
• H2 J. D. Turner, T. M. Benson, C. Christopoulos, D. W. P. Thomas, University of Nottingham; J. F. Dawson, M. D. Ganley, A. C. Marvin, S. J. Porter, M. P. Robinson, University of York, Heslington, United Kingdom: An evaluation of the shielding effectiveness of cabinets.
  
• H3 J. A. Catrysse, Kath. Hogeschool Brugge/KHBO, Oostende, Belgium: Comparative study of different combinations of metallized flexible shielding materials under mechanical stress.
  
• H4 C. Baum, Phillips Laboratory, Kirtland Air Force Base, USA: Damping transmission-line and cavity resonances.
  
• H5 T. Martin, M. Baeckstroem, J. LorÄn, FOA, Linkoeping, Sweden: Transmission cross section of apertures determined by measurements and FDTD simulations.
  
• H6 S. Celozzi, University of Rome "La Sapienza", Rome, Italy: Shielding effectiveness prediction in low-frequency, low-impedance source configurations.
  
• H7 L. Grcev, Z. Tasev, L. Kocarev, University of Skopje, Macedonia: Analysis of shielding characteristics of ferromagnetic cable shields in the time domain.
  
• H8 L. O. Hoeft, Consultant for Electromagnetic Effects, Albuquerque, USA: Comments on the line injection method for measuring the surface transfer impedance of cables.
  
  
I. Numerical modeling for EMC

• I1 F. M. Tesche, EMC Consultant, Dallas, USA: Numerical modeling for EMC.
  
• I2 M. Feliziani, University of L'Aquila; F. Maradei, University of Rome "La Sapienza", Italy: On the use of the Laplace equation to analyze low-frequency shielding problems.
  
• I3 S. Celozzi, University of Rome "La Sapienza", Italy: FE-TD analysis of ferromagnetic shields in the presence of near field sources.
  
• I4 N. Pena, M. Ney, Lab. for Electronics and Communication Systems, Brest, France: Superabsorbing conditions for timedomain field computations: Application to wideband shield characterization.
  
• I5 D. Poljak, V. Roje, University of Split, Croatia: Transient response of a thin wire in a twomedia configuration.
  
• I6 H.-D. Bruens, G. Buerger, M. Kimmel, Techn. University Hamburg-Harburg; J. Nitsch, WIS-ABC-Schutz, Munster, Germany: Treatment of geometrically thin single -and multilayers by the method of moments.
  
• I7 H.-F. Harms, Thyssen Nordseewerke, Emden; K.-H. Gonschorek, TU Dresden, Germany: The use of wiregrid structures in the combined analyses of MoM and GTD/UTD.
  
• I8 J. Kiwitt, A. Dietermann, M. Wojcikowski, K. Reiss, University of Karlsruhe, Germany: A new strategy for the calculation of radiation and EMI by successive crosscoupling computations.
  
  
J. Test facilities

• J1 P. F. Wilson, ABB Management Ltd., Baden-Daetwil, Switzerland: Test facilities.
  
• J2 A. Nothofer, A. Marvin, T. Konefal, University of York, Heslington, England: Radiated emission measurements in GTEM cells compared with those of an OATS.
  
• J3 S. Berger, Siemens Rolm Com., Austin, USA: An EMC diagnostic method for reverse modeling of a radiating source using GTEM readings.
  
• J4 L. Carbonini, Comtest Italia, Torino, Italy: A new transmission line device with double polarization capability for use in radiated EMC tests.
  
• J5 M. Boettcher, F. Reichert, F. Noack, Techn. University of Ilmenau, Germany: Numerical simulation of a GTEM-cell.
  
• J6 J.-G. Chu, M. Hirari, M. Hayakawa, University of Electro-Communication, Tokyo, Japan: On the optimal design of multilayered, wideband radiation absorbers.
  
• J7 J. Krause, G. Moenich, TU Berlin, Germany: New aspects of ferrite tile absorber optimization and corresponding measurements.
  
• J8 J. Haala, T. Zwick, W. Wiesbeck, University of Karlsruhe, Germany: Analysis and optimization of hybrid absorbers in order to improve the quality of anechoic chambers.
  
  
K. EMC education

• K1 A. Orlandi, University of L'Aquila, Italy: EMC: An educational challenge.
  
• K2 K. Williams, Eaton Corp., Southfield, USA: Electrical and EMC engineering education; an IEEE United States perspective.
  
• K3 M. Feliziani, University of L'Aquila; R. De Leo, University of Ancona, Italy: EMC education in Italian universities.
  
• K4 G. K. Deb, ER & DCI/Calcutta, India: Relevance of formal and nonformal EMC education in India.
  
• K5 S. Caniggia, Italtel, Milan, Italy: EMC models and experimental measurements used for educational purposes in the telecommunication industry.
  
• K6 W. Bundschuh, Fachhochschule Mannheim, Germany: EMC education at the Fachhochschule Mannheim.
  
• K7 Th. Jerse, The Citadel, Charleston, USA: An instructional program based on partial-element equivalent circuits (PEEC) used to demonstrate EMC design concepts.
  
• K8 A. Rodewald, Ingenieurschule beider Basel, Muttenz, Switzerland: A set of tutorial shielding experiments.
  
  
L. Coupling and transmission lines

• L1 F. Paladian, A. Essalhi, K. Kerroum, K. E. Drissi El Khamlichi, University Blaise Pascal-Clermont II, Aubiere, France: A timedomain model for computing the response of multiconductor transmission line networks.
  
• L2 K. Drissi El Khamlichi, K. Kerroum, F. Paladian, J. Wallart, University Blaise Pascal-Clermont II, Aubiere, France: Timedomain study of lossy multiconductor transmission lines having nonlinear loads.
  
• L3 M. Omid, Y. Kami, M. Hayakawa, University of Electro-Communication, Tokyo, Japan: Analysis of field coupling to nonuniform transmission lines.
  
• L4 L. Durris, M. Brissaud, P. Gonnard, A. Pelourson, LGEF INSA Lyon; J. L. Queri, Séchaud et Metz, Villeurbanne, France: Skin effect influence in a direct stroke to the lightning protection system of buildings.
  
• L5 M. D'Amore, M. S. Sarto, University of Rome "La Sapienza", Italy: Transient ground parameters and voltage sources in timedomain modeling of fieldexcited transmission lines.
  
• L6 V. Kuvshinnikov, Yu. V. Parfenov, Cent. Inst. of Physics & Technology, Sergiev Posad, Russia: Errors due to the use of the transmission line model for calculating HEMP-induced currents on aerial transmission lines.
  
• L7 F. Rachidi, M. Ianoz, Swiss Fed. Inst. of Technology, Lausanne, Switzerland; F. M. Tesche, EMC Consultant, Dallas, USA: Electromagnetic coupling to cables with shield interruptions.
  
• L8 F. Canavero, S. Salio, G. Vecchi, Politecnico di Torino, Italy: Voltage induced on a line by a nearby lightning stroke with a tortuous channel.
  
  
M. Emission and immunity testing

• M1 D. N. Heirman, AT&T Bell Laboratories, Lincroff, USA: Developments in emission and immunity testing.
  
• M2 R. Lorch, G. Moenich, TU-Berlin/Hochfrequenz, Berlin, Germany: A novel approach to open area test sites for electrically small radiators.
  
• M3 U. Jakobus, F. M. Landstorfer, University of Stuttgart, Germany: Numerical analysis of errors associated with antenna calibration and emission testing.
  
• M4 G. Cerri, R. De Leo, V. Mariani, M. Martiri, University of Ancona, Italy: Radiated emission estimation by measurement of magnetic near fields.
  
• M5 D. Zhu, Singapore Inst. of Standards, Singapore: Radiated electromagnetic emission prediction using a current probe.
  
• M6 H. Garbe, M. Koch, H. Haase, University of Hannover, Germany: Specification of alternative test sites with respect to given EMC field standards.
  
• M7 P. Corona, G. Ferrara, M. Migliaccio, Instituto Universitario Navale, Napoli, Italy: On the characterization of the electromagnetic field in a reverberating chamber.
  
• M8 E. L. Bronaugh, EdB EMC Consultants, Austin; J. J. Polonis, I. Martinez, Southwest Research Institute, San Antonio, USA: Whole-vehicle EMC testing in a reverberation chamber.
  
  
N. Low frequencies and power systems

• N1 G. Lucca, SIRTI S.p.A., Milano, Italy: Lines with earth return inside a tunnel.
  
• N2 W. Machczynski, Poznan Univ. of Technology, Poznan, Poland: Quasistationary conductive effects in coupled underground cables.
  
• N3 L. Grcev, V. Filiposki, University of Skopje, Macedonia: Earth potential distribution around highvoltage substations in rural and urban areas.
  
• N4 F. Fiori, V. Pozzolo, Politecnico di Torino, Italy: On the effects of RF interference in voltage regulator integrated circuits.
  
• N5 B. Akpebu, TU Dresden; Th. Benz, ABB Corporate Research, Heidelberg, Germany: Response of switchedmode power supplies to conducted transient disturbances.
  
• N6 G. Grandi, I. Montanari, U. Reggiani, University of Bologna, Italy: Effects of power converter parasitic components on conducted EMI.
  
• N7 B. V. Petrov, A. V. Kanischev, Moscow State Inst. of Electronics and Mathematics, Russia: Modeling of visual display units for the measurement of alternating electrical and magnetic fields.
  
• N8 A. Egloff, Suberg, Switzerland: Identification of disturbances in cathoderaytube monitors.
  
  
O. Circuit oriented techniques in EMC

• O1 A. Ruehli, IBM Research Division, Yorktown Heights, USA: Circuit oriented EM modeling techniques for EMC.
  
• O2 I. J. Craddock, C. J. Railton, University of Bristol, United Kingdom: Application of a circuitbased approach to ensuring the stability of modified finite difference timedomain algorithms.
  
• O3 W. J. R. Hoefer, University of Victoria, Victoria, Canada: Transmission line matrix (TLM) models of electromagnetic fields in space and time.
  
• O4 A. Cangellaris, University of Arizona, Tucson; M. Celik, Carnegie Mellon University, Pittsburg, USA: A new methodology for direct modeling of radiation coupling to interconnects using SPICE.
  
• O5 J. E. Garrett, IBM, Rochester; A. Ruehli, IBM Research Div., Yorktown Heights; C. Paul, University of Kentucky, Lexington, USA: Accuracy and stability advancements of the partial element equivalent circuit (PEEC) model.
  
• O6 G. Coen, D. De Zutter, University of Ghent, Belgium: Reduction of circuit complexity using tensor analysis of networks.
  
• O7 G. Coen, D. De Zutter, University of Gent, Belgium: Discrete circuit element modeling of complex impedances in partial element description networks.
  
  
P. Surges and transients

• P1 F. D. Martzloff, Nat. Inst. of Standards and Technoloy, Gaithersburg, USA: Surges and transients.
  
• P2 P. Lentilhac, A. Alcaras, J. C. Boudenot, Thomson-CSF/ Communications, Gennevilliers, France: Coupling of a lightning wave to the internal wiring system of a Faraday shield.
  
• P3 N. Derberel, Ph. Auriol, A. Ben Rhouma, CEGELY, Ecully, France: Modelling of the current distribution generated by a direct lightning stroke in a low-voltage installation.
  
• P4 Y. Chibisov, V. Loborev, Y. Parfenov, L. Zdoukhov, Central Inst. of Physics and Technology, Sergiev-Posad, Russia: Some results of an experimental study of highintensity electromagnetic fields coupling to power line equipment.
  
• P5 K. Borgeest, J. L. ter Haseborg, TU Hamburg-Harburg, Germany; M. S. Sarto, University of Rome "La Sapienza", Italy: Computeraided design of nonlinear protection circuits.
  
• P6 K. Dengler, K. Feser, W. Koehler, University of Stuttgart, Germany; B. Richter, ABB Hochspannungstechnik, Wettingen, Switzerland: A thermal and electrical model for MO-arrester degradation.
  
• P7 F. Heidler, W. Zischank, Fed. Armed Forces Univ. Munich, Neubiberg; Ch. Hopf, Siemens, Munich, Germany: Lightning electric field data used for the design of surge protection devices.
  
• P8 H. Bachl, Cooperative Testing Institute, Vienna, Austria; F. D. Martzloff, NIST, Gaithersburg; D. Nastasi, Power Electronics Appl. Center, Knoxville, USA: Using incandescent lamp failure levels for assessment of the surge environment.
  
  
Q. EM field standards and sensors

• Q1 L. M. Millanta, University of Florence, Italy: Fundamentals of the EMC current probes.
  
• Q2 Y. Kami, T. Tobana, University of Electro-Communication, Tokyo, Japan: Measurement of magnetic near fields on printed circuit boards by using a magnetic loop antenna.
  
• Q3 M. Schwerdt, J. Berger, K. Petermann, TU Berlin, Germany: An integrated optical E-Field sensor using a reflection scheme.
  
• Q4 H. Trzaska, Techn. University of Wroclaw, Poland: Frequency limitations in photonic EMF probes.
  
• Q5 B. R. Archambeault, SETH Corporation, Johnstown, USA: The repeatability and calibration consistency of a new electric field source.
• Q6 J. Glimm, K. Muenter, R. Pape, M. Spitzer, Physik.-Techn. Bundesanstalt PTB, Braunschweig, Germany: The new national standard of EM field strength; realisation and dissemination.
  
• Q7 H. Garn, M. Buchmayr, W. Muellner, Austrian Research Centre, Seibersdorf, Austria: Traceable antenna calibrations by using a reference antenna.
  
• Q8 A. Sugiura, K. Koike, H. Masuzawa, A. Ohtani, Comm. Research Laboratory/CRL, Tokyo, Japan: A method for measuring freespace antenna factors.
  
  
R. Modeling

• R1 C. R. James, Rome Lab./ERST, Rome; J. D. Norgard, University of Colorado, Colorado Springs, USA: Use of a helical coordinate system and finite differences to determine the charge densities and capacitances of a shielded twisted pair transmission line.
  
• R2 Y. Tarui, T. Takahashi, N. Schibuya, Takushoku University, Tokyo, Japan: Development of an EMC-constraint PCB design, placement and routing support tool.
  
• R3 F. Sabath, C-LAB/ASE, Paderborn; H. Garbe, University of Hannover, Germany: Prediction errors due to ignoring field coupling to printed circuit boards.
  
• R4 M. Klingler, Z. Zhang, M. Heddebaut, INRETS-LEOST, Villeneuve d'Ascq; S. Ficheux, UTAC, Linas-Montlhery, France: Modelling and simulation of normalized radiated or conducted tests.
  
• R5 H. Wagner, TU Hamburg-Harburg; K.-H. Gonschorek, TU Dresden, Germany: Electromagnetic radiation of wire loops connected to electrically large bodies.
  
• R6 J. R . Bergervoet, G. P. J. F. M. Maas, Philips Research Laboratories; M. J. C. M. van Doorn, Philips Consumer Electronics, Eindhoven, Netherlands: The commonmode skeleton model for assessment of electromagnetic compatibility at the system level.
  
• R7 B. R. Archambeault, SETH Corporation, Johnstown, USA: Multistage models for modeling EMI emissions for complex systems.
  
• R8 N. V. Korovkin, T. G. Minevich, E. E. Selina, State Technical University, St Petersburg, Russia: Calculation of transients in nonlinear systems, consisting of elements described by their frequency responses.