Preliminary Program EMC Zurich '03
Organized by:
Sponsor:
electrosuisse SEV - Association for Electrical Engineering, Power and Information Technologies
Cooperating:
Swiss Federal Institute of Technology Zurich (ETHZ)
International Telecommunication Union (ITU)
IEEE Electromagnetic Compatibility Society
International Union of Radio Science (URSI)
European Broadcasting Union (EBU)
China Institute of Electronics (CIE)
Institute of Electronics, Information and Communication Engineers, Japan (IEICE)
VDE Association for Electrical, Electronic & Information Technologies
Association of Polish Electrical Engineers (SEP)
Austrian Electrotechnical Association (ÖVE)
Finnish Electrotechnical Standards Association (SESKO)
Italian Electrotechnical and Electronic Association (AEI)
The Institution of Electrical Engineers (IEE)
Association of Electrical and Electronics Engineers (SEE)
German Association for EMC-Technology (DEMVT)
IEEE Switzerland Section
IEEE MTT-AP-EMC Chapter
Swiss Society of Engineers and Architects (SIA)
Honorary Chairman:
Prof. Dr. T. Dvorak, Stallikon
Organizing Committee:
Prof. Dr. R. Vahldieck, Zurich (Symposium President)
Prof. Dr. P. Leuthold, Zurich (Past-President)
Dr. E. Jurczek, Fehraltorf (Vice-President)
Dr. G. Meyer, Zurich (Symposium Chairman)
Prof. Dr. F. Tesche, Clemson (Technical Program Chairman)
Dr. B. Szentkuti, Berne (Technical Program Vice-Chairman)
Dr. F. Rachidi, Lausanne (Joint Events)
Dr. W. Borer, Fehraltorf (Public Relations)
Dr. H. Kramer, Zurich (Exhibition and Technical Excursions)
W. Blumer, Zurich (Registration)
Dr. G. Klaus, Staefa (Local Arrangements)
Dr. P. Leuchtmann, Zurich (Local Arrangements)
R. Danieli, Zurich (Local Arrangements)
Mrs. B. Howald, Zurich (Local Arrangements)
J. Ørum, Zurich (Local Arrangements)
C. Schmid, Zurich (Local Arrangements)
T. Meier, Zurich (Treasurer)
Mrs. E. Danieli, Zug (Social Program)
Technical Program Committee:
Chairman: Prof. F. M. Tesche
Prof. P. Degauque, Lille
Dr. G. Klaus, Staefa
Dr. P. Leuchtmann, Zurich
Dr. G. Meyer, Zurich
Dr. F. Rachidi, Lausanne
Prof. H. Singer, Hamburg
Dr. B. Szentkuti, Berne
TC-1: EMC Management, Dr. P. Wilson, Boulder
TC-2: EMC Measurement Techniques I (theory), Prof. J.L. ter Haseborg, Hamburg
TC-3: EMC Measurement Techniques II (practice), Prof. K.-H. Gonschorek Dresden
TC-4: EMC Environments I (stationary), Prof. M. Hayakawa, Tokyo
TC-5: EMC Environments II (transient), Dr. A. Kaelin, Wetzikon
TC-6: System Level EMC I (modeling), Dr. J.-P. Parmantier, Meudon
TC-7: System Level EMC II (practical EMC aspects), Dr. P. Beeckman, Eindhoven
TC-8: Chip & Package Level EMC, Dr. A. Ruehli, Yorktown Heights
TC-9: Lightning, Prof. V. Rakov, Gainesville
TC-10: EMC Innovation, Prof. A. Orlandi, L´Aquila
TC-11: Power System EMC, Prof. M. Ianoz, Lausanne
TC-12: EMC Protection, Dr. W. Radasky, Goleta
Advisory Committee:
Prof. D. J. Bem, Wroclaw
Dr. M. Ciappa, Zurich (IEEE Switzerland Section)
Prof. M. D´Amore (AEI), Rome
Prof. P. Degauque, Lille
Prof. K. Feser, Stuttgart (VDE)
Prof. Y. Gao, Beijing (CIE)
Prof. W. Hadrian, Wien (ÖVE)
H. Hediger, Zurich (SIA)
Prof. T. Hubing (IEEE EMCS)
Prof. M. Ianoz, Lausanne (URSI Swiss National Committee)
T. Ilomaeki, Helsinki (SESKO)
D. Imeson, West Wellow (IEE)
F. Joly, Paris (SEE)
R. W. Jones, Geneva (ITU Radiocommunication Bureau)
Dr. E. Jurczek, Fehraltorf (SEV)
W. Moron, Wroclaw (SEP)
Dr. T. O´Leary, Geneva (EBU)
Prof. F. Olyslager, Gent (URSI)
H.W. Ott (IEEE EMCS)
J. Schmitz, Rosenheim (DEMVT)
Prof. A. Sugiura, Sendai (IEICE)
Prof. R. Vahldieck, Zurich (IEEE MTT-AP-EMC Chapter)
Prof. T. Yoshino, Tokyo
Location, Transportation, Climate:
The Symposium and Technical Exhibition will be held at the main building of the Federal Institute of Technology Zurich (ETHZ), Rämistrasse 101, 8006 Zurich, phone: +411 632 22 11. The meeting place is within walking distance from the city centre and from the main railway station ("Hauptbahnhof") which has a direct connection with the airport. It may also be reached by tram No. 10 (tram stop "Hochschule") as well as by trams 6 and 9 from other parts of the city. Zurich (pop. 360'000), the centre of Swiss commerce and industry, is easily accessible through its international airport. Swiss International Air Lines is the official carrier for EMC Zurich'03. Excellent ground connections are also available to all major European cities. In February the ski season in the alpine resorts around Zurich culminates. Numerous one-day, or half-day bus tours depart every morning for sun and snow in the mountains. In Zurich we expect temperatures well above zero with first signs of spring.
Conference Registration:
To avoid inconvenient queueing it is recommended to register prior to the Symposium. At the conference the registration desks will be open from Monday, February 17 to Thursday, February 20, daily from 8.00 till 18.00. Admission to the conference is only possible after receipt of the registration fee.
Registration Fee:
Payment received before January 15, 2003:
Speakers, authors, chairmen, committee members SFr. 400.-
Other participants SFr. 500.-
Payment received after January 15, 2003:
Speakers, authors, chairmen, committee members SFr. 500.-
Other participants SFr. 600.-
The above full registration includes lectures, workshops, record, CD-ROM, exhibition catalogue, coffee and cocktail tickets and a five-day pass for the local public transportation (banquet not included).
Retired (> 64 y.) and Students (lectures and workshops only) SFr. 50.-
One-day ticket (lectures and workshops only) SFr. 210.-
Payments:
Payments may be made by:
- One of the credit cards quoted in the enclosed registration form.
- A check, drawn on a bank located in Switzerland, made payable to "EMC Zurich" and sent as enclosure with the registration form.
- A bank transfer to the account No. 251 880.100.43W (clearing no. 251), "EMC Zurich", at the Union Bank of Switzerland, CH-8032 Zurich-Roemerhof.
- Cash in SFr. at the registration desk.
To prevent inconveniences, make sure that the above instructions are exactly followed and that your name is quoted with all payments. Please note that you can be admitted to the conference only after we have received the full amount due. (Bank transfers usually take 3 to 4 weeks!) Registration fees will not be invoiced and their receipt will not be confirmed. Amounts paid can only be refunded if the withdrawal request reaches us before January 15, 2003. In any case SFr. 150.- will be retained for the symposium record which will be mailed to the address of the withdrawing participant.
Please make all payments in Swiss Francs (SFr.)!
Symposium Record and Reprints:
Additional copies of the record may be obtained during the Symposium at SFr. 130.. Thereafter, copies will be available for SFr. 150.-, including handling and mailing.
Additonal CD-ROMs will cost SFr. 40.-.
Up to 25 reprints of papers from the record may be ordered. Records and reprints from past symposia are also available in limited quantities. For records and reprints during the Symposium, contact Mr. R. Danieli, room F 26.2, during coffee breaks only! Thereafter direct your orders to the Organizing Committee.
Hotel Accommodation:
It is recommended to book your hotel well in advance, but in any case before January 15, 2003. A hotel reservation form is included for your convenience. Your reservation will be confirmed directly to your address.
After Jan. 15, contact directly ETH-Zentrum, IKT, by Fax: (+ 411) 632 12 09.
Zurich 2003 - Hotel Prices
Category
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A |
B |
C |
D |
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single |
- |
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70 - 90 |
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double |
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90 - 130 |
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single with
bath/shower |
250 - 360 |
170 - 250 |
100 - 180 |
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double with
bath/shower |
320 - 480 |
220 - 320 |
170 - 230 |
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Prices are in Swiss Francs, including breakfast, tax and service.
Further Information:
For further information contact the Symposium Chairman, Dr. G. Meyer, phone: (+ 411) 632 27 93, or the Organizing Committee:
Organizing Committee address:
Opening Ceremony
Tuesday, February 18, 9.00 sharp at the "Auditorium Maximum" of the Federal Institute of Technology. Welcome addresses by Prof. O. Kübler, President, ETHZ, Prof. T. Hubing, President IEEE EMC Society and representative of ITU-R. Keynote speaker: Dr. M. Repacholy, WHO Geneva - Possible health risks in mobile communications. Other prominent personalities will participate.
Sessions
The technical program of the Symposium features 19 sessions, in which about 130 papers will be presented reflecting the recent results of EMC science and technology. Sessions A, D, E, F, M, P and Q, have been organized by Invited Chairmen who proposed session topics and solicited submissions for review by the Program Committee. Their outstanding contribution to the technical program is gratefully acknowledged.
Tutorial Lectures
The tutorial lectures on Monday, February 17, will review basic principles in areas fundamental to EMC. The objective of the courses is to provide better understanding of the regular session material.
Workshops
The workshops and industrial forums cover selected areas of concern to the EMC engineer and manager. After introductory lectures, time will be reserved for questions and answers.
Open Meetings
URSI Commissions E, a research cooperation on sustainable mobile communication and the EMC WG of IARU Reg. 1 have coordinated their meeting schedules with the Symposium. They welcome observers attending and participating in the discussions.
Technical Exhibition
The exhibition will be directly adjoining the session rooms. Exhibits will range from instrumentation, measuring methods, shielding and components to EMC system design and education.
Reception:
On Tuesday, February 18, an Exhibitors Break beginning at 17.00 will provide lectures-free time for inspection of the exhibits before the Cocktail Party, opening at 18.30 in the EMC Exhibition. Be sure to wear your badge!
Symposium Banquet
Gala evening on Wednesday, February 19, 19.30 at Grand Hotel Dolder, Kurhausstrasse 65, Zurich. Courtesy buses depart at 19.15 from the Symposium building (rear entrance, underground passage). Dark suit and tie recommended.
Authors Lunch
All authors, session chairmen and symposium officers are cordially invited to participate as guests of the Symposium at a special Authors Luncheon given at the "Dozenten-Foyer of the ETHZ" (Thursday, February 20, at 12.30 sharp. Take the elevator to floor J).
Farewell Party
After the last sessions on Thursday, February 20, a farewell party in the Main Hall first floor will take place (17.30-18.30). We will say good bye and hope to see you again in the near future in Zurich.
Social Program - Tours
The social program includes a welcome tea on Tuesday, February 18, and special tours to the Abbey of St. Gallen, to the Monastery cheese show factory in Engelberg and to different famous Swiss Alpine resorts.
Technical Excursions
On Friday, February 21, two technical excursions will be organized: one to Logitech in the lake Geneva area, and another to EM Microelectronic a company of the Swatch Group in Marin.
Press conference
A press conference will be held on Wednesday, February 19, 15.30-16.30, room F 33.5 (German / English)
Authors attention!
For the oral presentation of your paper 17-20 minutes will be available, depending on session length and number of contributions.
Meet your session chairman at the "Symposium Officers Lounge", room G 60, according to the following time plan:
- Sessions ABC: Tuesday, February 18, 10.00 sharp
- Sessions DEFG: Tuesday, February 18, 13.30 sharp
- Sessions HIJ: Wednesday, February 19, 8.30 sharp
- Sessions KLM: Wednesday, February 19, 13.30 sharp
- Sessions NOP/QRS: Thursday, February 20, 8.30 sharp
Hand over your slides at the Audio-Visual room F 33.1 (Floor F)
- TUESDAY, FEBRUARY 18
WEDNESDAY, FEBRUARY 19
THURSDAY, FEBRUARY 20
A. Signal integrity and CAD modeling TUm
Invited Chairman: Prof. Dr. J. L. Drewniak
- A1 E. Laermans, D. De Zutter, Ghent University; J. Sercu, Agilent Technologies, Ghent, Belgium; S. Sercu, J. De Geest, FCI 's-Hertogenbosch, Netherlands: Signal integrity predictions using a modified method of moments approach.
- A2 C.-C. Kuo, T.-L. Wu, National Sun Yat-Sen University, Kaohsiung, Taiwan: A time-domain SPICE model for coupled interconnects using the multi-conductor layer peeling technique.
- A3 S. Grivet-Talocia, I.S. Stievano, I.A. Maio, F.G. Canavero, Politecnico di Torino, Turin, Italy: Full-wave modeling of interconnected digital devices.
- A4 S.-H. Min, M. Swaminathan, Georgia Institute of Technology, Atlanta, USA: Construction of passive macromodels from frequency data for simulation of distributed interconnect networks.
B. Radio noise TUm
Chairman: Prof. Dr. M. Hayakawa
- B1 W. Lauber, J. Bertrand, Communications Research Centre Canada/CRC, Ottawa, Canada: Update of VHF business noise data.
- B2 A.P. Nickolaenko, L.M. Rabinowicz, Ukrainian Nat. Academy of Sci., Kharkov, Ukraine; M. Hayakawa, University of Electro-Communications, Tokyo; K. Hattori, Chiba University, Chiba, Japan: Periodic variations of the Hurst exponent of the geomagnetic field.
- B3 A.V. Shvets, V.K. Ivanov, A.V. Varavin, Usikov's Inst. Radiophysics & Electronics, Kharkov, Ukraine: Schumann resonance observations within urban areas.
- B4 V.I. Larkina, IZMIRAN, Troitsk, Russia: The influence of the environment on low frequency noise radio measurements.
- B5 V.G. Khromykh, E.N. Desyatirikova, Voronezh State University of Civil Eng., Voronezh, Russia: The analysis of noise in synchronous cellular communication systems.
C. EM field sensors TUm
Chairman: Prof. Dr. J.-L. ter Haseborg
- C1 H. Frick, G.V. Meyer, Swiss Federal Inst. of Technology Zurich, Switzerland: An electro-optic E-field probe.
- C2 W. Mann, K. Petermann, Technical University Berlin, Germany: Miniaturized vertical cavity surface emitting laser based E-field probe with integrated preamplifier for time-domain measurements.
- C3 B.G. Loader, M.J. Alexander, W. Liang, National Physical Laboratory, Teddington, United Kingdom; S. Torihata, Tokin Corporation, Kawasaki-City, Japan: An optical electric field probe for specific absorption rate measurements.
- C4 E. Suzuki, T. Miyakawa, H. Ota, R. Sato, Sendai EMC Research Center; K.I. Arai, Tohoku University, Sendai, Japan: Characteristics of an optical magnetic probe consisting of a loop antenna element and a bulk electro-optical crystal.
- C5 J. D. Norgard, University of Colorado, Colorado Springs; J. E. Will, Sun Microsystems, Palo Alto; C. F. Stubenrauch, NIST, Boulder, USA: Thermographic / holographic images of phased array radar antenna aperture distributions.
D. Wired networks TUa
Invited Chairman: Dr. P. Beeckman
- D1 P.A. Beeckman, Philips Digital Systems Laboratory; J. van der Merve, Technical University of Eindhoven, Netherlands: Wired communication networks and EMC: An overview.
- D2 F. Weinmann, K. Dostert, University of Karlsruhe, Germany: Modelling of the far field radiation of widespread power line communication applications.
- D3 R. Vick, EMV-Beratungs- & Planungsbuero, Dresden, Germany: Estimating the radiated emissions of domestic main wiring caused by power-line communication systems.
- D4 I. Flintoft, A.C. Marvin, University of York; A.D. Papatsoris, D.W. Welsh, York EMC Services, Heslington, United Kingdom: Radiated emissions from unstructured networks: Potential impact on maritime and aeronautical radio services.
- D5 F.M. Tesche, Clemson University, Clemson; B.A. Renz, Amperion, Chelmsford; R.M. Hayes, American Electric Power, Columbus; R.G. Olsen, Washington State University, Pullman, USA: Development and use of a multiconductor line model for power line communication assessments.
- D6 D. Welsh, York EMC Services; A.C. Marvin, University of York, Heslington, United Kingdom: Investigation of telecommunication cabling relevant to EN 55022 modem test method.
E. Intentional EMI TUa
Invited Chairman: Dr. W.A. Radasky
- E1 W.A. Radasky, Metatech Corporation, Goleta, USA: Intentional EMI - Understanding the threat and developing protection concepts.
- E2 F. Sonnemann, Diehl Munitionssysteme, Roethenbach, Germany: Susceptibility investigations of high-power EM-fields on electronic systems.
- E3 D. Nitsch, F. Sabath, Res. Institute for Protective Technologies / WIS, Muenster; H.-U. Schmidt, Ch. Braun, Fraunhofer Institut / INT, Euskirchen, Germany: Comparison of the high power microwave and ultra wideband susceptibility of modern microprocessor boards.
- E4 M.A. Messier, K.S. Smith, W.A. Radasky, M.J. Madrid, Metatech Corporation, Goleta, USA: Response of telecom protection to three IEC waveforms.
- E5 C.E. Baum, Air Force Res. Lab., Kirtland AFB, USA: A transmission-line transformer for matching a switched oscillator to a higher-impedance load.
- E6 M. Koch, Autoflug, Rellingen; M. Camp, H. Garbe, University of Hannover; R. Kebel, Airbus Deutschland, Hamburg; F. Sabath, D. Nitsch, Scientific Institute for Protective Technologies / WIS, Muenster, Germany: Protection properties of advanced textile shields determined in frequency and time domain.
F. Base stations and non-ionizing radiation TUa
Invited Chairman: H. Ryser
- F1 G. Neubauer, H. Haider, K. Lamedschwandner, ARC Seibersdorf Research, Seibersdorf, Austria; M. Riederer, OFCOM, Bienne, Switzerland: Measurement methods and legal requirements for exposure assessment next to GSM base stations.
- F2 R. Coray, P. Kraehenbuehl, Swiss Federal Office for Communication/BAKOM, Biel, Switzerland: Non-ionizing radiation exposure assessment in the city of Salzburg: A study of the Swiss Federal Office for Communication.
- F3 M. Riederer, Swiss Fed. Office of Communications, Bienne, Switzerland; G. Neubauer, ARC Seibersdorf Research, Seibersdorf, Austria: Measuring the low power, instantaneous urban field strengths due to GSM base stations.
- F4 H. Lehmann, P. Fritschi, B. Eicher, Swisscom, Bern, Switzerland: The variability of the electric field in rooms near mobile phone base stations.
- F5 C. Olivier, L. Martens, Ghent University, Ghent, Belgium: Exposure assessment around UMTS base stations: Extension of existing measuring procedures.
- F6 H. Ryser, METAS, Bern-Wabern, Switzerland: Measuring campaign for the assessment of the non-ionising radiation near GSM base stations.
G. Transmission lines and cables TUa
Chairman: Dr. J.-P. Parmantier
- G1 M. Ye, Ericsson, Stockholm, Sweden: EMI radiation from shielded signal cable inside a subrack.
- G2 D. Bellan, G. Spadacini, S. Pignari, Politecnico di Milano, Milan, Italy: Prediction of twist non-uniformity and twist-residual effects on crosstalk in twisted-wire pairs.
- G3 M. Leone, Siemens, Erlangen, Germany: Closed-form expressions for the common-mode inductance of single and differential traces above a ground plane with a slit.
- G4 B. Zhang, X. Cui, M. Wu, Z. Zhao, L. Li, North China Electric Power University, Baoding City, China: Analysis of the effect of a two-end grounded cable on the performance of a large grounding grid.
- G5 G. Moenich, TU Berlin; M. Leone, Siemens, Erlangen, Germany: On the coupling of slits in electrically small enclosures to external cabling structures.
- G6 F. Kosdikian, F. Paumier, EADS, Suresnes; J.L. Ballenghien, Airbus France, Toulouse, France: EMC considerations for a new efficient and economic cabling system.
H. Test chambers WEm
Chairman: Dr. P. Leuchtmann
- H1 A. Nothofer, M.J. Alexander, National Physical Laboratory, Teddington; D. Bozec, D. Welsh, L. Dawson, L. McCormack, A.C. Marvin, University of York, Heslington, United Kingdom: A GTEM best practice guide - Applying IEC 61000-4-20 to the use of GTEM cells.
- H2 M. Schmidt, University of Applied Sciences, Jena, Germany: On calibration of field strength meters in GTEM cells: Practical aspects and uncertainty.
- H3 F. Xiao, K. Murano, Y. Kami, University of Electro-Communication, Tokyo, Japan: A new four-septum TEM cell with multi-polarizations for use in immunity testing.
- H4 F. Moglie, University of Ancona, Italy: Finite difference, time domain analysis convergence of reverberation chambers.
- H5 Ch. Bruns, Swiss Fed. Inst. of Technology Zurich, Switzerland: A three-dimensional method of moments simulation of a reverberation chamber in the frequency domain.
- H6 I. Junqua, F. Issac, B. Michielsen, C. Fiachetti, ONERA, Toulouse, France: Relation between variances of scattering parameters at an equipment input port tested in a reverberating chamber.
- H7 V. Deniau, J. Rioult, M. Heddebaut, M. Klingler, INRETS-LEOST; B. Demoulin, TELICE, Villeneuve d'Ascq, France: Comparison between the low frequency S-parameter reflection measurements in a reverberating chamber and in free space.
- H8 L.R. Arnaut, National Physical Laboratory, Teddington, United Kingdom: Non-stationary effects in mode-stirred reverberation chambers.
I. EMC modeling WEm
Chairman: Prof. Dr. H. Singer
- I1 M. Sabielny, H.-D. Bruens, TU Hamburg-Harburg, Hamburg, Germany: Practical aspects of the physical optics - MOM hybrid method.
- I2 U. Jakobus, I.P. Theron, EM Software & Systems, Stellenbosch, South Africa: Analysis of coated metallic surfaces with physical optics for the solution of high-frequency EMC problems.
- I3 A. Karwowski, M. Surma, D. Wojcik, Silesian University of Technology, Gliwice, Poland: Efficient wideband analysis of electromagnetic scattering and radiation problems using the AWE/MBPE adaptive method with the method of moments.
- I4 M.M. Danaei, M. Vahdani, Tehran University; J. Rashed-Mohassel, Emam Hosein University, Tehran, Iran: Analysis of external EM wave coupling to an arbitrary shape microstructure using method of moments.
- I5 N. Doncov, J. Wlodarczyk, R. Scaramuzza, V. Trenkic, Flomerics, Nottingham, United Kingdom: Modelling of airflow aperture arrays using the transmission line matrix (TLM) method.
- I6 S. Le Maguer, M.M. Ney, LEST, Brest, France: Split step TLM for efficient electromagnetic simulation of small heterogeneous apertures.
- I7 S. Pernet, X. Ferrieres, ONERA, Toulouse; G. Cohen, INRIA, Le Chesnay, France: An original finite element method to solve Maxell's equations in time domain.
- I8 J. Trinkle, A. Cantoni, K. Fynn, University of Western Australia, Crawley, Australia: Efficient impedance calculation of loaded power ground planes.
J. EMC innovation WEm
Chairman: Prof. Dr. A. Orlandi
- J1 J.A. Bracco, P. Burrascano, E. Cardelli, A. Faba, S. Fiori, University of Perugia, Italy: A possible identification and control technique of artificial EM sources.
- J2 J.M.G. Bueno, Chiclana, Spain: An EMI source finding method based on a neural network.
- J3 K. Aunchaleevarapan, S. Kaophenyai, NECTEC; W. Khan-Ngern, Y. Prempraneerach, King Monkut's Inst. of Technology, Bangkok, Thailand: Recognition and identification of a computer and an electronic ballast by radiated EMI using a neural network.
- J4 M. Heidemann, S. Fisahn, H. Garbe, University of Hannover; P. Kralicek, Fraunhofer Institute Reliability & Microintegration, Paderborn, Germany: Parameterization of a PCB-emission model by measurement.
- J5 G. Spadacini, S. Pignari, Politecnico di Milano, Milan, Italy: The statistical equivalence of bulk current injection and random-field radiation.
- J6 A. Bajwa, MED Labs, Perry Hall, USA: Broadband radar absorber design with a genetic algorithm, based on a R-L-C model of Salisbury screens.
- J7 I.S. Stievano, I.A. Maio, F.G. Canavero, Politecnico di Torino, Turin, Italy: Temperature-dependent macromodels of digital devices.
- J8 R. Saraei, J. Rashed-Mohassel, Tehran University, Tehran, Iran: Scalar and vector potentials in chiral media.
K. Emission and immunity testing WEa
Chairman: Prof. Dr. K.-H. Gonschorek
- K1 M. Windler, Underwriters Laboratories, Northbrook; D. Camell, NIST, Boulder, USA: Research on site qualifications above 1 GHz.
- K2 K. Osabe, T. Komatsusaki, Matsushita Communication Ind., Yokohama; T. Yamanaka, Akzo Nobel, Ibaraki; J. Kawano, Voluntary Control Council for Interference/VCCI, Tokyo, Japan: Experimental comparison of test site validation method with a half-wave dipole antenna and a biconical antenna.
- K3 T. Williams, Elmac Services, Chichester; S. Baker, Schaffner EMC Systems, Capel, United Kingdom: Uncertainty effects in conducted immunity testing.
- K4 M. Hoeijer, M. Baeckstroem, J. Loren, FOI, Linkoeping, Sweden: Angular patterns in low level coupling measurements and in high level radiated susceptibility testing.
- K5 S. Battermann, H. Garbe, University of Hannover, Germany: Optimizing an open area test site for horizontal and vertical polarization.
- K6 J. McLean, R. Sutton, TDK RF Solutions, Cedar Park, USA: Quantitative assessment of balancing errors in measurements on open area test sites.
- K7 F. Fiori, F. Musolino, Politecnico di Torino, Turin, Italy: Measurement of IC radiated emissions by a novel technique.
- K8 F. Fiori, P.S. Crovetti, Politecnic Univ. of Turin, Italy: Comparison of the susceptibility to EMI of MOS and BJT operational amplifiers.
L. Power and rail system and components WEa
Chairman: Prof. Dr. M. Ianoz
- L1 L. Mueller, K. Feser, University of Stuttgart, Germany: Experimental investigation and modeling of brush discharges for charged dielectric materials.
- L2 R. De Leo, V. Mariani Primiani, University of Ancona; R. Elisei, M. Marconi, COMELIT, Castelfidardo, Italy: Characterization of three winding transformers for the reduction of switched mode power supply conducted emissions.
- L3 V. Tarateeraseth, C. Tantisukarom, W. Khan-ngern, King Monkut's Inst. of Technology/KMITL, Bangkok, Thailand; S. Nitta, Salesian Polytechnic, Tokyo, Japan: A study of EMI characteristics of an off-line single-stage ac/dc flyback converter with power factor correction tapped transformers.
- L4 I. Voss, R. W. De Doncker, RWTH Aachen University of Technology, Aachen, Germany: High frequency behavior of a permanent-magnet synchronous motor.
- L5 G. Lucca, Sirti S.p.a., Milan, Italy: Statistical model of the radio frequency electromagnetic field emitted by an electrified railway line.
- L6 T.N. Serdyuk, Dnepropetrovsk Technical State University, Dnepropetrovsk, Ukraine: Influence of a railway traction system on nearby small-current devices.
- L7 B. Jaekel, Siemens Automation & Drives, Erlangen, Germany: EMC aspects of electronic interlocking in railway systems.
- L8 O. Bottauscio, G. Crotti, G. Farina, A. Manzin, IEN Galileo Ferraris; A. Canova, M. Tartaglia, Politecnico di Torino, Turin, Italy: Magnetic field generated by tramway systems and possible field mitigation.
M. Large chip and package EMC modeling WEa
Invited Chairmen: Dr. A. Ruehli, Prof. Dr. G. Antonini
- M1 G. Antonini, University of L'Aquila, Aquila, Italy; A. Ruehli, IBM Research Division, Yorktown Heights, USA: The fast evaluation of circuit elements for the partial element equivalent circuit method.
- M2 S. Celozzi, A. Araneo, University of Rome "La Sapienza", Rome, Italy: A general procedure for the extraction of lumped equivalent circuits from full-wave electromagnetic simulations of interconnect discontinuities.
- M3 G. Steinmair, BMW; H. Katzier, Siemens, Munich; R. Weigel, University Erlangen-Nuernberg, Erlangen; M. Troescher, Sim Lab Software, Munich, Germany: Switching noise simulation on packages and on PCBs using PEEC and model order reduction techniques.
- M4 G. Antonini, A. Orlandi, University of L'Aquila, Poggio di Roio, Italy; J. Ekman, Lulea Univ. of. Technology, Lulea, Sweden: Integration order selection rules for a full wave PEEC solver.
- M5 M. Leone, V. Navratil, Siemens, Erlangen, Germany: Analysis of the common-mode radiation from differential signalling on printed circuit boards.
- M6 M. de Magistris, Universita di Napoli "Federico II", Naples; A. Maffucci, Universita di Cassino, Italy: Identification of a SPICE reduced-order model for lossy interconnects from terminal behavior.
- M7 Th. Brandtner, Infineon Technologies, Graz; R. Weigel, University of Linz, Austria: Simulation and analysis of substrate coupling accelerated by precalculated macromodels.
- M8 E. Gad, M. Nakhla, Carleton University, Ottawa, Canada: Efficient simulation of nonuniform transmission lines using the integrated congruent transform.
N. Automotive EMC THm
Chairman: Dr. F. Rachidi
- N1 R. Neumayer, A. Stelzer, University Linz, Austria; R. Weigel, Universitaet Erlangen-Nuernberg, Erlangen; G. Steinmair, F. Haslinger, BMW; M. Troescher, SIMLAB; J. Held, B. Unger, Siemens, Muenchen, Germany: Numerical EMC simulation for automotive applications.
- N2 J.P. Parmantier, X. Ferrieres, S. Bertuol, ONERA, Toulouse, France; A. Ruddle, Motor Industry Research Assoc., Nuneaton, United Kingdom: Modeling of EM coupling onto vehicle wiring using combined finite-volume/finite-difference time-domain and cable network methods.
- N3 R. Zaridze, K. Tavzarashvili, G. Ghvedashvili, D. Kakulia, G. Saparishvili, A. Bijamov, Tbilisi State University, Tbilisi, Georgia: The method of auxiliary sources for numerical modeling of EMC/EMI in vehicles and specific absorption rate problems.
- N4 A.R. Ruddle, MIRA, Nuneaton, United Kingdom: Computed impact of optional vehicle features (sunroof and windscreen heater) on automotive EMC characteristics.
- N5 F. Crisci, M. De Riso, ELASIS, Pomigliano; R. De Leo, V.M. Primiani, University of Ancona, Italy: A comparison of immunity test methods for automotive testing.
- N6 A.R. Ruddle, MIRA, Nuneaton, United Kingdom: Measured impact of common vehicle components on the coupling of electromagnetic fields into vehicles and their wiring harnesses.
- N7 F. Duval, B. Mazari, B. Freyre, Ph. Lefebvre, J. Zigault, ESIGELEC IRSEEM, Mt. Saint Aignan; O. Maurice, VALEO, Creteil, France: Bulk current injection test modeling and creation of a test methodology.
O. System EMC THm
Chairman: Dr. A. Kaelin
- O1 S.F. Legowski, D.P. Barp, University of Wyoming, Laramie, USA: Empirical study of spectral distribution of EMI emissions of modern adjustable speed drives.
- O2 C. Keller, K. Feser, University of Stuttgart, Germany: Non-linear superposition of broadband spectra for fast emission measurement in time domain.
- O3 M. Ouzzif, F. Moulin, A. Zeddam, F. Gauthier, France Telecom, Lannion, France: Evaluation of the impulse noise impact on DMT-VDSL system performance.
- O4 F. Deter, Bauknecht Hausgeraete, Schorndorf; L. Dunker, Reg. TP, Berlin; W. Kleppmann, Fachhochschule Aalen, Germany: New method for the statistical evaluation of RFI measurements.
- O5 O.M. Ramahi, University of Maryland, College Park; T. Kamgaing, Motorola Semiconductor Products Sector, Tempe, USA: Mitigation of simultaneous switching noise using electromagnetic band gap structures.
- O6 A. Knobloch, H. Garbe, University of Hannover, Germany: Bit error rates due to CW-interference.
- O7 F. Arteche, F. Szoncso, CERN, Geneva, Switzerland; C. Rivetta, Fermilab, Batavia, USA: Electromagnetic compatibility plan for the compact muon solenoid detector at CERN.
- O8 C.A. Ropiak, D.C. Stoudt, Naval Surface Warefare Center, Dahlgren, USA: Conditioned hardening.
P. Lightning and its effects THm
Invited Chairman: Prof. Dr. V. Rakov
- P1 V.A. Rakov, M.A. Uman, D.E. Crawford, J. Schoene, J. Jerauld, K.J. Rambo, G.H. Schnetzer, University of Florida, Gainesville, USA; M. Miki, CRIEPI, Tokyo, Japan: Close lightning electromagnetic environment: Triggered lightning experiments.
- P2 B. Kordi, University of Manitoba, Winnipeg, Canada; R. Moini, Amirkabir Univ. of Technology, Tehran, Iran; V.A. Rakov, University of Florida, Gainesville, USA: Comparison of lightning return stroke electric fields predicted by the transmission line and antenna theory models.
- P3 J.M. Cvetic, B.V. Stanic, University of Belgrade, Serbia and Montenegro; F. Heidler, Fed. Armed Forces University Munich, Neubiberg, Germany: Behaviour of the rise and fall characteristics of the channel discharge function for the generalized lightning traveling current source return stroke model.
- P4 N. Taavousi, R. Moini, S.H.H. Sadeghi, Amirkabir Univ. of Technology, Tehran, Iran: A neural network method for locating cloud-to-ground lightning stroke channels, using radiated electric field waveform data.
- P5 A. Ageyev, Seversk State Institute of Technology, Seversk, Russia; A. Gandelli, R.E. Zich, Politecnico di Milano, Italy: Analysis of lightning signals by a Haar-based wavelet approach.
- P6 L. Grcev, Techn. University Eindhoven, Netherlands: Dynamic behavior of ground grids.
- P7 G. Maslowski, R. Ziemba, Rzeszow University of Technology, Rzeszow, Poland: The magnetic field attenuation inside a structure with an unscreened window for the case of direct and nearby lightning strikes.
- P8 S.Vakil, Lockheed Martin Company, Saratoga, USA: An investigative analysis of lightning protection of circuit interfaces with inherent series and/or parallel impedances.
Q. Analysis of electrically large systems THa
Invited Chairman: Prof. Dr. J. Nitsch
- Q1 J. Nitsch, H. Mecke, Z.A. Styczynski, G. Wollenberg, Otto-von-Guericke University Magdeburg, Germany: Analysis methods for electrically large systems - From the particular to the general (FOR 417).
- Q2 R. Doebbelin, T.K. Czarnecki, H. Mecke, Th. Winkler, Otto-von-Guericke University Magdeburg, Germany: Magnetic fields in the vicinity of welding installations.
- Q3 A. Bachry, Z.A. Styczynski, Otto-von-Guericke University Magdeburg, Germany; I.I. Golub, Energy Systems Intitute, Irkutsk, Russia: An evaluation of distribution power system susceptibility to low frequency conducted disturbances under different load conditions.
- Q4 C.E. Baum, Air Force Res. Lab. Kirtland AFB, USA; T. Steinmetz, Otto-von-Guericke University Magdeburg, Germany: An interpolation technique for analyzing sections of nonuniform multiconductor transmission lines.
- Q5 H. Haase, University of New Mexico, Albuquerque, USA: Investigation of simple nonuniform transmission-line structures by a generalized transmission-line theory.
- Q6 S. Tkachenko, J. Nitsch, T. Steinmetz, Otto-von-Guericke University Magdeburg, Germany; F. Rachidi, Swiss Fed. Inst. of Technology, Lausanne, Switzerland: Electromagnetic field coupling to nonuniform transmission lines: Treatment of discontinuities.
- Q7 G. Wollenberg, S.V. Kochetov, Otto-von-Guericke University Magdeburg, Germany: Modeling the skin effect in wire-like 3D interconnection structures with arbitrary cross section by a new modification of the PEEC method.
- Q8 H.G. Krauthaeuser, Otto-von-Guericke University Magdeburg, Germany: Excitation and boundary condition effects in mode-stirred chambers and their consequences for calibration and measurement.
R. Shielding THa
Chairman: Prof. Dr. P. Degauque
- R1 M. Istenic, University of Ljubljana, Slovenia; R.G. Olsen, Washington State University, Pullman, USA: A simple hybrid method for optimizing the performance of 2-D planar conductive ELF magnetic field shields.
- R2 A. Binner, K.-H. Gonschorek, Dresden Univ. of Technology, Dresden, Germany: Design of nonlinear magnetic shields using the finite-element-method.
- R3 A. Albini, P. Burrascano, E. Cardelli, A. Faba, University of Perugia, Italy: Studies of non-oriented Si-Fe iron multilayer shields at industrial frequencies.
- R4 Th.M. Schaefer, J. Maurer, W. Wiesbeck, Universitaet Karlsruhe, Germany: Attenuation measurement of different walls and rooms in hospitals.
- R5 M. D'Amore, M.S. Sarto, M. Bertolotti, M.C. Larciprete, M. Scalora, C. Sibilia, University of Rome "La Sapienza"; F. Sarto, ENEA Research Center, Rome, Italy: Nanotechnology of transparent electromagnetic shields.
- R6 A. Gavrilakis, A.P. Duffy, De Montfort University, Leicester; K.G. Hodge, A.J. Willis, Brand-Rex, Glenrothes, United Kingdom: An enhanced model for a helically wound tape shield.
- R7 B. Colak, TUBITAK UEKAE, Kocaeli; O. Cerezci, Sakarya University, Sakarya, Turkey; N. Ari, Univ. of Applied Sciences, Zurich, Switzerland: Modelling of electrically contacting double braid coaxial cable shields as triaxial cable shields.
- R8 G. Cerri, P. Russo, University of Ancona, Italy: A MFIE-FDTD hybrid method for the evaluation of the field inside metallic enclosures with slots.
S. Instrumentation and measurement THa
Chairman: Dr. P. Wilson
- S1 K. Muenter, R. Pape, M. Spitzer, J. Glimm, Physik.-Techn. Bundesanstalt/PTB, Braunschweig; R. Bitzer, Wavetek Wandel Goltermann, Eningen u. A., Germany: Traceable calibration of magnetic field transfer sensors up to 1 GHz using a radiated standing wave pattern.
- S2 H. Hirayama, Y. Kami, University of Electro-Communications, Tokyo, Japan: Near-field measurement using a Yee scheme for source location and Poynting vector evaluation.
- S3 F.J. Sanchez, M. Quilez, Univ. Politecnica de Catalunya, Castelldefels; P. Riu, F. Silva, Univ. Politecnica de Catalunya, Barcelona, Spain: A low-cost analog fiber optic link for EMC applications.
- S4 A. Maeda, VCCI, Tokyo; S. Takeya, S. Kobayashi, Akzo Nobel, Ibaraki; S. Ohtsu, T. Yamagajo, Fujitsu, Nakahara, Japan: Development of an antenna-factor calibration method for EMI testing in quasi-free space.
- S5 S. Boenisch, W. Kalkner, Technical University Berlin, Germany: Influence of the approach speed, charge voltage and electrode material on the intensity and reproducibility of short gap electrostatic discharges.
- S6 S. Coets, V. Beauvois, Universite de Liege; J. Catrysse, KHBO, Oostende; W. Legros, Universite de Liege, Belgium: Accuracy considerations for conducted emission measurements performed on large systems.
- S7 H. Ryser, METAS, Bern-Wabern, Switzerland: Experience with new calibration and test site validation methods for the absorbing clamp.
- S8 J. Sroka, Schaffner EMC, Luterbach, Switzerland: Oscilloscope influence on the calibration uncertainty of the peak current of ESD simulators.
Chairman: Dr. F. Rachidi, Lausanne, Switzerland
Objective: The objective of the tutorial presentations is to provide overviews of the basics of certain important EMC topics for the purpose of assisting the attendees in their understanding of the material presented in the technical sessions.
T1. Modeling and Simulation of Electrical Interconnects, Packages, and Devices for High-Speed Applications
(Monday, February 17, 11.00 - 13.00, room F 5)
Lecturer: Prof. F. Canavero, Politecnico di Torino, Turin, Italy; Prof. M. Nakhla, Carleton University, Ottawa, Canada; Dr. A. Ruehli, IBM Research Division, Yorktown Heights, NY, USA
Topics: With increasing demands for high signal speeds and circuit density, non-ideal behavior of interconnects and components have become more and more important for the performance and EMC compliance of modern electronic devices and systems.
This tutorial presents an overview of state-of-the-art techniques for electrical interconnect and packaging modeling, for their reduced-order equivalent circuit extraction, and for behavioral characterization of digital devices.
Applications cover a wide spectrum of implementation hierarchy, from chip level to printed circuit boards.
Lectures:
- Introduction and motivation (F. Canavero)
- Electromagnetic modeling of EIP´s (A. Ruehli)
- Model order reduction techniques (M. Nakhla)
- Macromodeling via system identification (F. Canavero)
- Behavioral models of digital devices (F. Canavero)
T2. Genetic Algorithms for EMC Applications
(Monday, February 17, 14.00 - 16.00, room F 5)
Lecturer: Prof. G. Antonini and Prof. A. Orlandi, University of L´Aquila, Italy
Topics: Optimization problems often arise in EMC and EMI problems. The objective functions that are found in electromagnetic optimization problems are usually highly non-linear, stiff, multi-extremal and non-differentiable. In addition they are often computationally expensive to evaluate. Standard deterministic optimization methods have significant drawbacks when applied to this kind of problems. Genetic algorithms (GA´s) have shown appealing properties which make them suitable for electromagnetic optimization problems involving many parameters in a high-dimension multi-modal function domain. They are robust, stochastic search methods modeled on the principles and concepts of natural selection and evolution. The Tutorial will introduce the GA´s themselves and will provide the audience with guidelines for the implementation of successful GA´s. In particular GA´s operators are introduced and their implementation is discussed. Step-by-step procedures are given with associated code to offer the audience the opportunity to try GA´s. Some simple examples for EMC optimization problems are presented, giving hints and suggestions.
T3. EM Simulators Theory and Practice
(Monday, February 17, 9.00 - 17.00, room F 3)
Lecturer: Prof. W.J.R. Hoefer, University of Victoria, Canada; Dr. D.G. Swanson Jr., Forem, Amesbury, USA
Topics: The proliferation of computer tools for electromagnetic field analysis, design and optimization is having a profound effect on the working environment of EMC engineers. While most practitioners can use such tools after a certain period of training, many remain skeptical as to the trustworthiness of numerical results and hesitate about the limits, errors, and significance of the data generated. The key is to understand what goes on inside these tools and how they solve electromagnetic fields.
The purpose of this tutorial is to provide insight into the operating principles of electromagnetic simulators, and to show how these translate into their properties as engineering tools. The tutorial will be of benefit to:
- EMC engineers familiar with linear and non-linear CAD who would like to learn more about field solvers,
- Experienced users of electromagnetic simulators who seek a better understanding of their theoretical and computational foundations,
- Researchers familiar with computational electromagnetics who would like to learn more about the requirements, concerns and methodology of EMC practitioners.
T4. Reciprocity and EMC Measurements
(Monday, February 18, 16.30 - 18.00, room F 5)
Lecturer: Dr. Jasper J. Goedbloed, Philips Research, Eindhoven, The Netherlands
Topics: Reciprocity theorems for electrical networks and electromagnetic fields allow us to better understand the mechanisms that play a role in EMC measurements or to facilitate EMC measurements.
This tutorial paper presents the theorems, their accompanying mathematical relations, and quite a number of practical applications that demonstrate the usefulness of these theorems. These applications, particularly of interest to experimentalists and EMC test-house engineers, cover the field of transfer function, filter and conversion measurements, the relevance of antenna factors, probe calibration, aspects of radiated emission in relation to compliance uncertainty and radiated immunity measurements. Also the reciprocity of shielding effectiveness and interference prediction are addressed.
W1. Quantitative Data Comparisons
(Wednesday, February 19, 9.00 - 12.30, room F 3)
Chairman: Dr. A. Duffy, De Montfort University, Leicester, UK
Contributors: Dr. D. Johns (Flomerics), A. Ruddle (MIRA), C. Jones (BAE Systems), Prof. R. Simpson (Simtronics), D. Coleby (De Montfort University)
Topics: Within the EMC community, the need to compare the results of measurements or predictions is widespread. Such comparisons could be for:
- The validation of numerical models, or model implementations, against experimental results.
- The assessment of repeatability of measurements whether carried out by the same personnel in the same facilities or different personnel in different facilities.
- The assessment of the level of excursion of measurements/models from accepted norms for a given system.
- The quantification of changes in measurements or predictions as a result of design or implementation changes.
Traditionally, such comparisons have been carried out by-eye on graphically presented results or acceptability criteria have been based on heuristics determined from significant experience of the system being tested or designed. There does appear to be some movement towards identifying methods to compare such data quantitatively rather than just qualitatively, as such a comparison can minimise latent subjectivity.
The aims of this workshop are:
- To provide the EMC community with a forum for the discussion of current research on the topic.
- To identify the needs of the EMC community for quantitative comparisons.
- To identify application areas where such techniques would be well suited.
- To stimulate additional research on this topic and identify other approaches used by industry.
W2. Power Line Communications (PLC)
(Wednesday, February 19, 14.00 - 17.30, room F 3)
Chairman: Dr. P.A. Beeckman, Philips Digital Systems Laboratory, Eindhoven, Netherlands
Contributors: Dr. P.A. Beeckman (Philips Digital Systems Laboratory), Dr. D. Hansen (Euro EMC Services), M. Stecher (Rohde & Schwarz), M. Bogers (EC), Prof. P.A. Brown (White Box Solutions), J.H. Stott (BBC), S. Roper (NSINE)
Topics: Power Line Communication (PLC) is a new technology that uses existing power network infrastructure for future broadband network services. PLC is considered as an opportunity for both access and in-home networks. The advantage of PLC is that existing power network infrastructure can be used. However, in Europe, EMC is considered as a key risk. Authorities in Germany and the UK require emission limits 20 to 40 dB below the current CISPR 22 emission limits, while the industry even want higher emission limits in order to make broadband services possible. A joint CENELEC/ETSI working group is dealing with the EMC standardization aspects of PLC.
The subjects covered by this workshop are:
- Review of the several EMC aspects of PLC including some history
- The EMC regulatory aspects on power line networks in Europe, the Network Mandate M/313; protection of radio services; limits
- Developments within ETSI/Cenelec/CISPR; description of committees and their work programmes; limits & compliance methods
- In-home PLC product opportunities and their EMC aspects
- Emission limits and the protection of domestic broadcast services
- Access PLC products and their EMC aspects
W3. Emission Measurements with Alternative Methods
(Thursday, February 20, 9.00 - 12.30, room F 3)
Chairman: Prof. H. Garbe, University of Hannover, Germany
Contributors: Prof. H. Garbe, Dr. P. Wilson, Dr. C. Holloway, Dipl.-Ing. M. Heidemann
Topics:
- Requirements to electromagnetic field tests: Compliance test (OATS), system integration, product specific tasks
- Test object size, antenna pattern complexity and implications for emission and immunity testing
- Modelling of EuT: Dipole (total radiated power), multipole (near field interaction)
- Alternative methods to generate the model: Fully anechoic rooms, reverberation chambers, near field scans, TEM waveguides/TEM cells.
W4. GEMCAR European Project
(Thursday, February 20, 14.30 - 17.30, room F 3)
Chairman: A. Ruddle, MIRA, Nuneaton, United Kingdom
Contributors: . Ruddle (MIRA), I. Hendrikx (Hevrox), Dr. X. Ferrieres, Dr. J.P. Parmentier (ONERA), A. Rubinstein, Dr. F. Rachidi (EPFL), Dr. S. Alestra, Dr. R. Perraud (EADS), Dr. M. Granstrom, M. Theander (Volvo TDC), A. Gunsaya (Ford Motor Company), F. Subaru, F. Druesne (CETIM), N. Whyman (QinetiQ)
Topics: GEMCAR (Guidelines for Electromagnetic Compatibility Modelling for Automotive Requirements) is a three-year collaborative research project supported by the EU under the Framework V programme "Competitive and Sustainable Growth". The aim of this project is to generate guidelines concerning applications and methods for modelling vehicle level automotive EMC issues. Nonetheless, these guidelines may well be of interest for other industries and applications. The purpose of this workshop is therefore to present and discuss the results of the project. The workshop will end with an opportunity for further questions and open discussion between the project partners and the audience.
Objective: Industrial Forums are a new presentation platform for EMC companies - in particular for the the Symposium Exhibitors - with the objective of providing the attendees some practical and industrial aspects of EMC activities. The planned forums are as follows:
F1. Industrial Forum 1
(Tuesday, February 18, 10.30 - 12.30, room E1.2)
Chairman: Dr. G. Klaus
Contributions:
- F1.1 Comparison of 100 Accredited German EMC Test Laboratories
J. Glimm, M. Spitzer, K. Muenter, R. Pape, Physik.-Techn. Bundesanstalt, Braunschweig; L. Dunker, R. Egner, DATech-Geschaeftsstelle, Frankfurt a.M., Germany
F1.2 An Analysis of Finnish EMC Market Surveillance and Suggestions for its Development
J. Rajamaeki, Safety Technology Authority of Finland/TUKES, Helsinki, Finland
F1.3 Electrical Design and Characterization Methodologies Applied in the Development of FlexBench - a Rapid Prototyping Equipment
F. De Pieri, M. Ferloni, M. Gaio, R. Gemelli, M. Grassi, C. Meani, M. Pavesi, V. Costa, Itatel, Settimo Milanese, Italy
F1.4 Reducing Errors due to Resonances in Radiated and Conducted EMC Testing
R.C. Marshall, Richard Marshall Ltd., Harpenden, United Kingdom
F2. Industrial Forum 2
(Tuesday, February 18, 14.00 - 17.00, room E1.2)
Chairman: M. Nyffeler
Contributions:
- F2.1 Comparison of Immunity and Emission Measurements in a Reverb Chamber
G. D´Abreu, ETS-Lindgren, Eura, Finland
Short Description: The purpose of this presentation is to demonstrate the efficiency and repeatability of performing immunity and emission measurements in two reverb chambers of greatly different sizes. The characterization data for both chambers will be presented in addition to the results of an immunity test on a device with known immunity and an emission measurement in the frequency band known to coincide with the emissions from the device. Some data will also be presented from tests done in a GTEM and OATS for reference.
- F2.2 Innovation Process Management Towards a Sustainable Portfolio of Safe and Competitive Products
Dr. W.J. Borer, Electrosuisse and Neosys AG, Fehraltorf, Switzerland
Short Description: The innovation process will be described, consisting of the four phases strategy / portfolio, creation of product ideas, product development, and market introduction. Particular emphasis will be put on the aspects of total safety / risks, quality, environmental aspects, and product liability.
- F2.3 Ergonomic Manuals for Sustainable Product Safety and Quality
M. Aellig, Electrosuisse, Fehraltorf, Switzerland
Short Description: TSM success manuals are based on a new concept by which ergonomic design risk analysis, standards conformity assessment, and usability tests are combined in order to obtain instructions for use (manuals) through which the user of a product / appliance gets easily understandable instructions for a safe and trouble-free use of his product / appliance.
OA. Open Meetings of URSI Commission E
International Radio Science Union (URSI)
Commission E: Electromagnetic Noise and Interference
(Monday, February 17, 16.30-18.30, GEP-Pavillon)
Organizer: Prof. P. Degauque, Chairman Commission E
Commission E WG (Chairmen):
- Spectrum Utilization/Management and Wireless Telecommunications. (G. Hurt, USA; R. Struzak, Switzerland)
- Intentional Electromagnetic Interference. (M. Wik, Sweden; W. Radasky, USA)
- High Power Electromagnetics. (C. E. Baum, R.L. Gardner, USA)
- Terrestrial and Planetary Lightning Generation of Electromagnetic Noise. (Z. Kawasaki, Japan; V. Cooray, Sweden)
- Interaction with, and Protection of, Complex Electronic Systems. (J. Nitsch, Germany; P. Degauque, France; M. Ianoz, Switzerland, J. P. Parmentier, France)
- Effects of Transients on Equipment. (J. ter Haseborg, Germany; V. Scuka, Sweden; B. Demoulin, France)
- Extra-Terrestrial and Terrestrial Meteorologic-Electric Environment. (H. Kikuchi, Japan)
- Geoelectromagnetic Disturbances and Their Effects on Technological Systems. (M. Hayakawa, Japan, R. Pirjola, Finland)
- Interference and Noise at Frequencies Above 30 MHz. (J. Gavan, Israel)
OB. Exposure to GSM Radiation
(Tuesday, February 18, 10.30 - 12.30, room F 3)
Organizer: Dr. G. Dürrenberger, Research Foundation on Mobile Communication, Zurich, Switzerland
Chairman: Prof. W. Bächtold, Swiss Federal Institute of Technology, Zurich, Switzerland
Contents: The session will present results from research projects funded by the Swiss Research Foundation on Mobile Communication. Contributions on: Impact of exposure to electromagnetic fields of type GSM on sleep-EEG and regional cerebral blood flow, cell-mortality in magnetite-producing bacteria exposed to GSM radiation, biological effects of low-level RF radiation on C. elegans and P. patens, Tradescantia micronucleus bioassay for detecting mutagenity of GSM fields, analysis of indoor RF-field distribution.
OC. IARU Open Meeting on EMC Problems Experienced and Caused by Radio Amateurs
International Amateur Radio Union, Region 1, EMC Working Group
(Tuesday, February 18, 17.30 - 18.30, GEP-Pavillon)
Chairman: C. M. Verholt, OZ8CY
Topics:
- Compatibility between shortwave radio reception and the different kinds of digital data communication.
- The EU Commission mandate 313 and related topics.
- The application of the EMC Directive in interference cases.
- Regulation of human exposure to electromagnetic fields.
- Other EMC topics of interest for radio amateurs.
Organizer: Mrs. E. Danieli, Zug, Switzerland
Tuesday, February 18: A welcome tea will be offered to all spouses and guests accompanying conference participants. Information about the tours will be given there.
Meeting point: Fountain in the reception hall, 14.30.
S1: Wednesday, February 19: Visit of the city of St. Gallen, the metropolitan centre of eastern Switzerland with its cultural attraction - the famous Abbey-District - which was included in the UNESCO list of culture world heritage in 1983. After lunch we see the 150 years old "Chocolate-Land" Maestrani. 8.30 - 16.15.
S2: Thursday, February 20: Sightseeing tour to Engelberg with the scenic beauty of a high Alpine valley. We visit the Monastery and see cheese being made by hand in the Monastery cheese show factory. After lunch you have time for a short walk in the mountain village. 8.00 - 16.30.
S3: Friday, February 21: Scenic bus journey through Central Switzerland, along Lake Lucerne. Short city tour of Lucerne and continuation to Kriens, where a cable car takes you to the top of Mt. Pilatus (2132 m / 7000 ft) into a mystical, white winter paradise. According to the legend, kind dragons used to inhabitate this mountain! Discover the Dragon Path and enjoy the spectacular panorama (if there is nice weather). Lunch on Mount Pilatus.
S4: Friday and Saturday, February 21 - 22: Ride to Interlaken and Grindelwald, enjoy nature or even wintersports (all equipment may be rented). Overnight in Interlaken, scenic train journey over the Kleine Scheidegg to Lauterbrunnen and Mürren, top of Schilthorn (2970 m) with a fine meal in the revolving restaurant.
Individual postconvention tours to excellent wintersport resorts may be organized either in advance (contact the Organizing Committee) or at the Symposium Information Desk. For the excursions S3 and S4 contact the Information Desk not later than Wednesday, Feb. 19, 13.00. Minimum participance 20 persons. Bus departure from Symposium building, underground passage. Please register as soon as possible (limited participance).
The following parallel visits are planned for Friday, February 21
E1: Logitech SA, Romanel-sur-Morges
Logitech is a leader of innovation and design in human computer interface devices. Visit of the product development laboratories for all kind of cordless devices, near to the Lake Geneva. Lunch is provided. Friday, Feb. 21, 8.00 - 18.00.
E2: EM Microelectronic, a Swatch Group Company in Marin
EM Marin is a semiconductor manufacturer that designs and produces ultra low power, low voltage, digital, analog and mixed ICs. Includes a visit of the production facilitiy. Lunch is provided. Friday, February 21, 8.00 - 17.00.
Bus departure from Symposium building, underground passage. Since the number of places are limited, confirm your advance registration at the Information Desk until Wednesday, February 19, 13.00 !
Exhibition Chairman: Dr. H. Kramer, IKT ETH , Zurich, Switzerland
The exhibition area, located adjoining the session rooms, will be open daily (February 18 - 20) from 9.30 till 18.00 except on Thursday, when it closes at 16.30. An exhibition catalogue will be made available. Access to the exhibition is free.
For information concerning the exhibition see the exhibiters web-page or contact the Organizing Committee
PROVISIONAL LIST OF EXHIBITORS
(As of October 1, 2002)
AGILENT TECHNOLOGIES CO., USA
ALBATROSS PROJECTS GMBH, Germany
AMPLIFIER RESEARCH CORP., USA
ARC SEIBERSDORF RESEARCH GMBH, Austria
CST, Germany
EM SOFTWARE & SYSTEMS - SA (PTY) LTD., South Africa
EM TEST AG, Switzerland
EMC PARTNER AG, Switzerland
EMERSON & CUMING, Belgium
EMITEC AG, Switzerland
ETS-LINDGREN, USA
IEEE EMC SOCIETY, USA
JAQUIER EMC SERVICE SA/AG, Switzerland
LECROY SA, Switzerland
LUETHI ELEKTRONIK - FEINMECHANIK AG, Switzerland
METEOLABOR AG, Switzerland
MONTENA EMC SA, Switzerland
NARDA SAFETY TEST SOLUTIONS GMBH, Germany
PMM S.R.L., Italy
PRANA, France
ROHDE & SCHWARZ GMBH & CO KG, Germany
SCHAFFNER EMC AG, Switzerland
SIBALCO, W. SIEGRIST & CO. AG, Switzerland
SIEPEL, France
SIMLAB SOFTWARE GMBH, France
SPITZENBERGER + SPIES GMBH, Germany
TELEMETER ELECTRONIC GMBH, Switzerland